journal article·2008-06

Synthesis and physical behaviour of In2S3 films

N. Revathi, P. Prathap, K.T. Ramakrishna Reddy

Applied Surface Science· Volume 254· Issue 16
Publisher page

Abstract

Abstract In2S3 layers have been grown by close-spaced evaporation of pre-synthesized In2S3 powder from its constituent elements. The layers were deposited on glass substrates at temperatures in the range, 200–350 °C. The effect of substrate temperature on composition, structure, morphology, electrical and optical properties of the as-grown indium sulfide films has been studied. The synthesized powder exhibited cubic structure with a grain size of 63.92 nm and S/In ratio of 1.01. The films grown at 200 °C were amorphous in nature while its crystallinity increased with the increase of substrate temperature to 300 °C. The films exhibited pure tetragonal β-In2S3 phase at the substrate temperature of 350 °C. The surface morphological analysis revealed that the films grown at 300 °C had an average roughness of 1.43 nm. These films showed a S/In ratio of 0.98 and a lower electrical resistivity of 1.28 × 103 Ω cm. The optical band gap was found to be direct and the layers grown at 300 °C showed a higher optical transmittance of 78% and an energy band gap of 2.49 eV.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Semiconductor materials and interfaces

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (29)

Show source-provided references
1. Amlouk · Jpn. J. Appl. Phys. 1 · 1999 · 38 · 2610.1143/JJAP.38.26 ↗
2. Diehl · J. Crystal Growth · 1975 · 28 · 30610.1016/0022-0248(75)90067-6 ↗
3. Kambas · Sol. Energy Mater. · 1981 · 13 · 97
4. Yu · Mater. Res. Bull. · 1998 · 33 · 71710.1016/S0025-5408(98)00048-8 ↗
5. Dalas · J. Mater. Sci. · 1993 · 28 · 659510.1007/BF00356401 ↗
6. Hara · Sol. Energy Mater. Sol. Cells · 2000 · 62 · 44110.1016/S0927-0248(00)00027-1 ↗
7. Dericioglu · J. Eur. Ceram. Soc. · 2003 · 23 · 95110.1016/S0955-2219(02)00205-4 ↗
8. Bayon · Appl. Surf. Sci. · 2000 · 158 · 4910.1016/S0169-4332(99)00576-0 ↗
9. Shazly · J. Phys. Condens. Matter · 1998 · 10 · 594310.1088/0953-8984/10/26/019 ↗
10. Nomura · Thin Solid Films · 1990 · 198 · 33910.1016/0040-6090(91)90351-W ↗
11. Kim · J. Appl. Phys. · 1968 · 60 · 263110.1063/1.337137 ↗
12. George · Phys. Status Solidi (a) · 1988 · 106 · 12310.1002/pssa.2211060116 ↗
13. Subbaiah · Physica B · 2005 · 365 · 24010.1016/j.physb.2005.05.020 ↗
14. Patel · Mater. Lett. · 1985 · 3 · 44010.1016/0167-577X(85)90136-3 ↗
15. Ritter · J. Vac. Sci. Technol. · 1969 · 6 · 73310.1116/1.1315744 ↗
16. Maiti · Thin Solid Films · 1994 · 239 · 10410.1016/0040-6090(94)90115-5 ↗
17. Stirn · Appl. Phys. Lett. · 1986 · 48 · 179010.1063/1.96788 ↗
18. Chougnet · Thin Solid Films · 2006 · 495 · 4010.1016/j.tsf.2005.08.296 ↗
19. Sandoval-Paz · Thin Solid Films · 2005 · 472 · 510.1016/j.tsf.2004.05.096 ↗
20. Chopra · 1969
21. Fujihara · Appl. Surf. Sci. · 2001 · 180 · 34110.1016/S0169-4332(01)00367-1 ↗
22. Rrichelt · Thin Solid Films · 1990 · 191 · 9110.1016/0040-6090(90)90277-K ↗
23. Sherif · J. Mater. Sci.: Mater. Electron. · 1996 · 7 · 39110.1007/BF00180775 ↗
24. Warren · 1990
25. Thomson · Annu. Rev. Mater. Sci. · 2000 · 30 · 15910.1146/annurev.matsci.30.1.159 ↗
26. Fujimura · J. Cryst. Growth · 1993 · 130 · 26910.1016/0022-0248(93)90861-P ↗
27. Mathew · J. Appl. Phys. · 2006 · 100 · 3350410.1063/1.2221531 ↗
28. Calixto-Rodriguez · Thin Solid Films · 2005 · 480 · 13310.1016/j.tsf.2004.11.046 ↗
29. Dow · Phys. Rev. B · 1972 · 5 · 59410.1103/PhysRevB.5.594 ↗