KPFM imaging of Si(1 1 1)5×5-Sb surface for atom distinction using NC-AFM
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OpenAlex topics: Force Microscopy Techniques and Applications · Mechanical and Optical Resonators · Integrated Circuits and Semiconductor Failure Analysis
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References (17)
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1. Giessibl · Science · 1995 · 267 · 6810.1126/science.267.5194.68 ↗
2. Kitamura · Jpn. J. Appl. Phys. · 1995 · 34 · L14510.1143/JJAP.34.L145 ↗
3. Sugawara · Science · 1995 · 270 · 164610.1126/science.270.5242.1646 ↗
4. S. Morita, R. Wisendonger, E. Meyer (Eds.), “Noncontact Atomic Force Microscopy”, Springer, NonoScience and Technology Series, Heidelberg, (2002) pp. 65–68.10.1007/978-3-642-56019-4 ↗
5. Nonnenmacher · Appl. Phys. Lett. · 1991 · 58 · 292110.1063/1.105227 ↗
6. Umeda · Jpn. J. Appl. Phys. · 2001 · 40 · 438110.1143/JJAP.40.4381 ↗
7. Sugimura · Jpn. J. Appl. Phys. · 2001 · 40 · L17410.1143/JJAP.40.L174 ↗
8. Kitamura · Appl. Surf. Sci. · 2000 · 157 · 22210.1016/S0169-4332(99)00530-9 ↗
9. Okamoto · Appl. Surf. Sci. · 2002 · 188 · 38110.1016/S0169-4332(01)00953-9 ↗
10. Saranin · Surf. Sci. · 2000 · 447 · 1510.1016/S0039-6028(99)01202-9 ↗
11. Ko · Phys. Rev. B · 1999 · 59 · 458810.1103/PhysRevB.59.4588 ↗
12. Park · Jpn. J. Appl. Phys. · 1988 · 27 · 14710.1143/JJAP.27.147 ↗
13. Andrieu · J. Appl. Phys. · 1991 · 69 · 136610.1063/1.347274 ↗
14. Park · J. Vac. Sci. Technol. A · 1997 · 15 · 157210.1116/1.580634 ↗
15. Elswijk · Phys. Rev. B · 1991 · 44 · 380210.1103/PhysRevB.44.3802 ↗
16. Park · Phys. Rev. B · 1997 · 55 · 926710.1103/PhysRevB.55.9267 ↗
17. Kusumi · Surf. Sci. · 1997 · 372 · 2810.1016/S0039-6028(96)01137-5 ↗