Improved interatomic potential for stressed Si, O mixed systems
Source abstract
Abstract
Abstract We propose an improved formula of a previous interatomic potential for Si, O mixed systems. The new potential is designed so as to more accurately reproduce the structural property of compressively strained SiO 2 structures, by reducing unnatural steric hindrance caused by a long-range part of a three-body term. As the results of the improvement, (1) compressive stress in SiO 2 film, which was highly overestimated to be 13 GPa by the earlier potential, is reduced to 2.7 GPa, and (2) a spurious peak in Si–O pair correlation function of SiO 2 film disappeared. A limitation of the conventional interatomic potentials and its solution are also discussed.
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Research context
OpenAlex topics: High-pressure geophysics and materials · Boron and Carbon Nanomaterials Research · X-ray Diffraction in Crystallography
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References (14)
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