Using angle resolved ESCA to characterize Winchester disks
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Abstract
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Force Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
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References (7)
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2. Linder · IEEE Trans. MAG. · 1982 · 18 · 107310.1109/TMAG.1982.1062144 ↗
3. Wagner · Surface Interface Anal. · 1981 · 3 · 22110.1002/sia.740030506 ↗
4. Moulder · Res. Develop. · 1985 · 2
5. Hammond · Corrosion Sci. · 1981 · 21 · 23910.1016/0010-938X(81)90033-0 ↗
6. Fadley · Progr. Surface Sci. · 1984 · 16 · 310.1016/0079-6816(84)90001-7 ↗
7. Seah · Surface Interface Anal. · 1979 · 1 · 210.1002/sia.740010103 ↗