Toward a scanning atom probe — computer simulation of electric field -
Bibliographic record
Abstract
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Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Force Microscopy Techniques and Applications · Surface and Thin Film Phenomena
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References (9)
Show source-provided references
1. Müller · 1969
2. Miller · 1989
3. Nishikawa · J. Vac. Sci. Technol. B · 1983 · 1 · 610.1116/1.582506 ↗
4. Nishikawa · J. Vac. Sci. Technol. B · 1983 · 1 · 1010.1116/1.582533 ↗
5. Nishikawa · Phys. Rev. Lett. · 1984 · 53 · 125210.1103/PhysRevLett.53.1252 ↗
6. Nishikawa · J. Chem. Phys. · 1986 · 85 · 675810.1063/1.451407 ↗
7. Nishikawa · Phys. Rev. B · 1988 · 37 · 368510.1103/PhysRevB.37.3685 ↗
8. Good · Handb. Phys. · 1956 · 21 · 176
9. Gomer · 1961