journal article·2026-02

A wafer-scale method for the characterization of 2D MoS2 layers

T. Meyer, S. Cadot, B. Dey, T. Vollaire, P. Brunet, P. Quéméré, N. Gauthier, V.-H. Le, D. Mariolle, H. Okuno, B. Smiri, T. Gouth, M. Pichois, E. Nolot, L. Le Van-Jodin

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OpenAlex topics: 2D Materials and Applications · Graphene research and applications · MXene and MAX Phase Materials

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