journal article·2025-08

Identifying the weakest interface in BEOL structures

Dong Jun Kim, Sun Woo Lee, Won Choi, Ho Jun Chang, Inhwa Lee, Seungju Park, Jihyun Lee, Joong Jung Kim, Sumin Kang, Taek-Soo Kim

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OpenAlex topics: Advanced ceramic materials synthesis · Copper Interconnects and Reliability · Semiconductor materials and devices

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