Infrared photoinduced force near-field spectroscopy of silicon carbide
Source abstract
Abstract
International audience
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Near-Field Optical Microscopy · Force Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (66)
Show source-provided references
1. Material science and device physics in SiC technology for high-voltage power devices
2. Overview of high voltage sic power semiconductor devices: development and application10.23919/TEMS.2017.8086104 ↗
3. The critical issues of SiC materials for future nuclear systems10.1016/j.scriptamat.2017.03.001 ↗
4. Radiation effects in SiC for nuclear structural applications10.1016/j.cossms.2012.03.005 ↗
5. A review on single photon sources in silicon carbide10.1088/1361-6633/aa5171 ↗
6. Silicon carbide color centers for quantum applications
7. Recent progress in synthesis, properties and potential applications of SiC nanomaterials10.1016/j.pmatsci.2015.01.003 ↗
8. Review paper: Residual stresses in deposited thin-film material layers for micro- and nano-systems manufacturing10.3390/mi13122084 ↗
9. Silicon carbide technology for advanced human healthcare applications10.3390/mi13030346 ↗
10. SiC nanostructures toward biomedical applications and its future challenges10.1080/10408436.2016.1150806 ↗
11. Raman scattering characterization on SiC10.1016/j.mee.2005.10.037 ↗
12. Annealing effects on structural, optical and electrical properties of al implanted 4H-SiC
13. Broadband-infrared assessment of phonon resonance in scattering-type near-field microscopy10.1103/PhysRevB.83.045404 ↗
14. Modern scattering-type scanning near-field optical microscopy for advanced material research10.1002/adma.201804774 ↗
15. A guide to nanoscale IR spectroscopy: resonance enhanced transduction in contact and tapping mode AFM-IR10.1039/D2CS00095D ↗
16. Photothermal AFM-IR spectroscopy and imaging: Status, challenges, and trends10.1063/5.0063902 ↗
17. Photo-induced force microscopy (PiFM)–principles and implementations10.1039/D2CS00052K ↗
18. Photo induced force microscopy: chemical spectroscopy beyond the diffraction limit10.1039/D2QM00040G ↗
19. Phonon-enhanced light–matter interaction at the nanometre scale10.1038/nature00899 ↗
20. Exploiting phonon-resonant near-field interaction for the nanoscale investigation of extended defects10.1002/adfm.201907357 ↗
21. Infrared nanoscopy of strained semiconductors10.1038/nnano.2008.399 ↗
22. Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy10.1364/OE.17.022351 ↗
23. Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy10.1364/OE.15.008550 ↗
24. Nanoscale resolved infrared probing of crystal structure and of plasmon-phonon coupling10.1021/nl060092b ↗
25. High-fidelity nano-FTIR spectroscopy by on-pixel normalization of signal harmonics10.1515/nanoph-2021-0565 ↗
26. Quantitative analysis of sideband coupling in photoinduced force microscopy10.1103/PhysRevB.94.195407 ↗
27. What do different modes of AFM-IR mean for measuring soft matter surfaces?10.1021/acs.langmuir.3c02950 ↗
28. Photoinduced force microscopy: A technique for hyperspectral nanochemical mapping10.7567/JJAP.56.08LA04 ↗
29. Nanoscale chemical imaging by photoinduced force microscopy10.1126/sciadv.1501571 ↗
30. Tip-enhanced thermal expansion force for nanoscale chemical imaging and spectroscopy in photoinduced force microscopy10.1021/acs.analchem.8b02871 ↗
31. Observation of nanoscale opto-mechanical molecular damping as the origin of spectroscopic contrast in photo induced force microscopy10.1038/s41467-020-19067-3 ↗
32. Atomic force spectroscopies: A toolbox for probing the biological matter
33. Selective excitation and imaging of ultraslow phonon polaritons in thin hexagonal boron nitride crystals10.1038/s41377-018-0039-4 ↗
34. Probing polaritons in 2D materials10.1002/adom.201901416 ↗
35. Contrast and imaging performance in photo induced force microscopy10.1364/OE.25.026923 ↗
36. Spectroscopic nanoimaging of all-semiconductor plasmonic gratings using photoinduced force and scattering type nanoscopy10.1021/acsphotonics.8b00700 ↗
37. Photoinduced tip–sample forces for chemical nanoimaging and spectroscopy10.1021/acs.nanolett.8b01899 ↗
38. Surface-phonon-polariton-enhanced photoinduced dipole force for nanoscale infrared imaging10.1093/nsr/nwae101 ↗
39. Label-free detection of biotoxins via a photo-induced force infrared spectrum at the single-molecular level10.1039/C9AN01338E ↗
40. Nanoscale spectroscopic origins of photoinduced tip–sample force in the midinfrared10.1073/pnas.1913729116 ↗
41. Stable fluorescence of eu3+ complex nanostructures beneath a protein skin for potential biometric recognition10.3390/nano11092462 ↗
42. Monitoring fast thermal dynamics at the nanoscale through frequency domain photoinduced force microscopy10.1021/acs.jpcc.1c00874 ↗
43. Applications of photoacoustic sensing techniques10.1103/RevModPhys.58.381 ↗
44. Optical heterodyne profilometry10.1364/AO.20.000610 ↗
45. Heterodyne force microscopy of PMMA/rubber nanocomposites: nanomapping of viscoelastic response at ultrasonic frequencies10.1088/0022-3727/33/19/301 ↗
46. Systematic study of anodic etching of highly doped N-type 4H-SiC in various HF based electrolytes10.1149/2.082309jes ↗
47. High quality single crystal recrystallization of thin 4H-SiC films deposed by PVD techniques, a way for new emerging fields10.4028/p-w0ryrj ↗
48. P-type doping of 4H-SiC for integrated bipolar and unipolar devices
49. Temperature dependence of the anisotropy of the infrared dielectric properties and phonon-plasmon coupling in n-doped 4H-SiC10.1016/j.jpcs.2023.111861 ↗
50. Near-field microscopy by elastic light scattering from a tip10.1098/rsta.2003.1347 ↗
51. Quantitative measurement of local infrared absorption and dielectric function with tip-enhanced near-field microscopy10.1021/jz400453r ↗
52. Finite dipole model for extreme near-field thermal radiation between a tip and planar SiC substrate10.1016/j.jqsrt.2017.02.001 ↗
53. FTIR study of the oxidation of porous silicon10.1021/jp963322r ↗
54. Critical role of silicon nanoparticles surface on lithium cell electrochemical performance analyzed by FTIR, Raman, EELS, XPS, NMR, and BDS spectroscopies10.1021/jp503949y ↗
55. Kinetics of capillary condensation in nanoscopic sliding friction10.1103/PhysRevLett.88.185505 ↗
56. Field-induced formation of nanometer-sized water bridges10.1103/PhysRevLett.91.056101 ↗
57. Structural, optical, and surface science studies of 4H-SiC epilayers grown by low pressure chemical vapor deposition10.1007/BF02666658 ↗
58. Determining the water content of nominally anhydrous minerals at the nanometre scale10.1063/5.0025570 ↗
59. SiC structural characterization by non destructive near-field microscopy techniques
60. Theory of infrared nanospectroscopy by photothermal induced resonance10.1063/1.3429214 ↗
61. Novotny · 2012 · 446
62. Spectral frustration and spatial coherence in thermal near-field spectroscopy
63. Model for the unpolarized infrared reflectivity from uniaxial polar materials: Effects of anisotropy, free carriers, and defects10.1016/j.infrared.2011.10.005 ↗
64. Raman scattering from anisotropic LO-phonon–plasmon–coupled mode in n-type 4H–and 6H–SiC10.1063/1.360174 ↗
65. Infrared nanoscopy of Dirac plasmons at the graphene–SiO2 interface10.1021/nl202362d ↗
66. The channeling effect of al and n ion implantation in 4H–SiC during JFET integrated device processing10.1016/j.nimb.2015.07.033 ↗