Chemical alteration of poly(vinyl fluoride) Tedlar® induced by exposure to vacuum ultraviolet radiation
Source abstract
Abstract
Abstract In this study the chemical alteration of poly(vinyl fluoride) Tedlar® by vacuum ultraviolet radiation (VUV) (115–400 nm) has been examined using X-ray photoelectron spectroscopy (XPS). The initial F/C atom ratio of 0.34 decreases to 0.17 after a 2-h exposure. The F/C atom ratio is further reduced to a steady-state value of approximately 0.04 after a 24-h exposure. Similarly, the O/C atom ratio is reduced from 0.08 to 0.05 and then to 0.02 during these two exposures. As the F and O are removed by VUV exposure, the C concentration increases from 70.5 to 82.0 and then to 94.6 at.% thus forming a graphitic or amorphous carbon-like layer which erodes more slowly than the virgin Tedlar surface. Exposure of the VUV-damaged surface to O2 results in chemisorption of O, indicating that reactive sites are formed during the chemical erosion by VUV. Further exposure to VUV removes this chemisorbed oxygen but a subsequent exposure to air at atmospheric conditions causes a three-fold increase in O chemisorbed at the surface. Comparison of XPS data indicates that the mechanisms of chemical alteration by VUV radiation and hyperthermal (∼5 eV) atomic oxygen (AO) are similar.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Silicone and Siloxane Chemistry · Polymer Nanocomposite Synthesis and Irradiation · Polymer Nanocomposites and Properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (43)
Show source-provided references
1. FEP Teflon, TFE Teflon, Tefzel, Tedlar and Kapton are registered trademark names by E.I. du Pont Nemours & Co. Inc.
2. Banks · 1997
3. Leger · J. Spacecraft Rockets · 1986 · 23 · 50510.2514/3.25837 ↗
4. Koontz · J. Spacecraft Rockets · 1995 · 32 · 48310.2514/3.26641 ↗
5. Tennyson · Can. J. Phys. · 1991 · 69 · 119010.1139/p91-180 ↗
6. Koontz · J. Spacecraft Rockets · 1995 · 32 · 47510.2514/3.26640 ↗
7. Reddy · J. Mater. Sci. · 1995 · 30 · 28110.1007/BF00354389 ↗
8. Packirisamy · J. Mater. Sci. · 1995 · 30 · 30810.1007/BF00354390 ↗
9. Reddy · Eur. Space Agency J. · 1992 · 16 · 193
10. de Groh · J. Spacecraft Rockets · 1994 · 31 · 65610.2514/3.26492 ↗
11. Grossman · J. Spacecraft Rockets · 1999 · 36 · 7510.2514/2.3435 ↗
12. DeGroh · High Perform. Polym. · 2000 · 12 · 8310.1088/0954-0083/12/1/307 ↗
13. Dever · High Perform. Polym. · 2000 · 12 · 12510.1088/0954-0083/12/1/310 ↗
14. Rasoul · J. Appl. Polym. Sci. · 1995 · 58 · 185710.1002/app.1995.070581024 ↗
15. Hoflund · Appl. Surf. Sci. · 2005 · 239 · 36710.1016/j.apsusc.2004.05.283 ↗
16. Wolan · J. Vac. Sci. Technol. A · 1999 · 17 · 66210.1116/1.582027 ↗
17. S.H. Phillips, R.I. Gonzalez, K.P. Chaffee, T.S. Haddad, G.B. Hoflund, B.S. Hsiao, B.X. Fu, in: S. Ruth, C. Lee (Eds.) Proceedings of the 45th International SAMPE Symposium (45), Technomic Publishing Co. Inc., Lancaster, PA, 2000, p. 1921.
18. Gonzalez · J. Spacecraft Rockets · 2000 · 37 · 46310.2514/2.3606 ↗
19. Hoflund · J. Adhesion Sci. Technol. · 2001 · 15 · 119910.1163/156856101317048707 ↗
20. R.I. Gonzalez, S.J. Tomczak, T.K. Minton, A. Brunsvold, G.B. Hoflund, Proceedings of the Forty-ninth International SAMPE Symposium, Technomic Publishing Co. Inc., Lancaster, PA, 2002, p. 1488.
21. Pruden · J. Polym. Sci. A · 2003 · 41 · 148610.1002/pola.10681 ↗
22. Shyichuk · J. Polym. Sci. A · 2003 · 41 · 107010.1002/pola.10645 ↗
23. Salazar · J. Polym. Sci. B · 2002 · 40 · 18110.1002/polb.10079 ↗
24. Salazar · J. Polym. Sci. B · 2002 · 40 · 19210.1002/polb.10080 ↗
25. Salazar · J. Polym. Sci. A · 2003 · 41 · 113610.1002/pola.10656 ↗
26. Nagata · J. Polym. Sci. A · 2003 · 41 · 293010.1002/pola.10884 ↗
27. Hsiao · J. Polym. Sci. A · 2003 · 41 · 42010.1002/pola.10585 ↗
28. Gelin · J. Polym. Sci. A · 2003 · 41 · 16010.1002/pola.10553 ↗
29. Hsiao · J. Polym. Sci. A · 2003 · 41 · 200110.1002/pola.10748 ↗
30. Lu · J. Polym. Sci. · 2004 · 42 · 92510.1002/pola.11054 ↗
31. Furukawa · J. Polym. Sci. A · 2003 · 41 · 270410.1002/pola.10817 ↗
32. Fujiwara · J. Polym. Sci. · 2003 · 41 · 274310.1002/pola.10819 ↗
33. Zuev · J. Polym. Sci. A · 2003 · 41 · 376110.1002/pola.10945 ↗
34. Liu · J. Polym. Sci. A · 2003 · 41 · 235410.1002/pola.10778 ↗
35. Hoffmann · J. Polym. Sci. A · 2004 · 42 · 55110.1002/pola.10878 ↗
36. ASTM Designation: E 490-00a, Standard Solar Constant and Zero Air Mass Solar Spectral Irradiance Tables, ASTM, West Conshohocken, PA, 2000.
37. Hoflund · Meas. Sci. Technol. · 1994 · 5 · 20110.1088/0957-0233/5/3/001 ↗
38. Gilbert · Rev. Sci. Instrum. · 1982 · 53 · 128110.1063/1.1137158 ↗
39. Savitzky · Anal. Chem. · 1964 · 36 · 162710.1021/ac60214a047 ↗
40. 1992 · 54
41. 1979
42. Hoflund · 1998 · 57
43. Everett · Macromolecules · 2004 · 37 · 601310.1021/ma049515r ↗