journal article·2011-01

Circular and rectangular via holes formed in SiC via using ArF based UV excimer laser

L. Liu, C.Y. Chang, Wenhsing Wu, S.J. Pearton, F. Ren

Applied Surface Science· Volume 257· Issue 6
Publisher page

Abstract

Circular via holes with diameters of 10, 25, 50 and 70 μm and rectangular via holes with dimensions of 10 μm × 100 μm, 20 μm × 100 μm and 30 μm × 100 μm and drilled depths between 105 and 110 μm were formed in 300 μm thick bulk 4H-SiC substrates by ArF based UV laser drilling (λ = 193 nm) with a pulse width of ~30 nsec and a pulse frequency of 100 Hz. The drilling rate was linearly proportional to the fluence of the laser, however, the rate decreased for the larger via holes. The laser drilling produces much higher etch rates (229-870 μm/min) than conventional dry etching (0.2-1.3 μm/min) and the via entry can be tapered to facilitate subsequent metallization.
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Research context

OpenAlex topics: Advanced Surface Polishing Techniques · Thin-Film Transistor Technologies · Laser Material Processing Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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