journal article·2008-12

Micro-indentation of metallic photonic crystals: experimental and numerical investigations

Michael Sheyka, Ihab El-Kady, Tariq Khraishi, Mahmoud M. Reda Taha

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Abstract

Photonic crystals (PCs) are synthetic materials that are used to control light propagation. PCs have a frequency bandgap where light is forbidden to propagate. This bandgap is strongly tied to the microstructure of the photonic crystal. Three-dimensional tungsten photonic crystal in a Lincoln-log microstructure has been suggested as a strong alternative filter in photovoltaic cells with significantly high power efficiency. PCs have also been suggested as sensors for submicron damage. Therefore, mechanical characterization of three-dimensional photonic crystals becomes of interest. Here we report on mechanical characterization of tungsten PC using means of micro-indentation. We also present a three-dimensional finite element simulation of the structural response of a Tungsten photonic crystal under micro-indentation load. Stresses developed in the PC can be used to quantify the level of damage in the crystal. We compare our simulation results with the experimental observations of a Vickers and Knoop micro-indentation experiments of tungsten PC. The FE models were proven able to simulate the mechanical response of the PC with a good accuracy. The calibrated FE models can be further used to realize the mechanical behavior of PC under different thermal and mechanical stresses when used as filters in photovoltaic cells or to simulate the effect of damage in PC sensors.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Photonic Crystals and Applications · Photonic and Optical Devices · Plasmonic and Surface Plasmon Research

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References (25)

Show source-provided references
1. ANSYS: Ansys Reference Manual. Version 10.0. Available via http://www.ansys.com/ (2007)
2. Bažant, Z.P.: Scaling laws in mechanics of failure. J. Eng. Mech. 119, 1828–1844 (1993). doi: 10.1061/(ASCE)0733-9399(1993)119:9(1828)10.1061/(ASCE)0733-9399(1993)119:9(1828) ↗
3. Biswas, R., El-Kady, I., Lin, S.Y., Ho, K.M.: Enhanced complete photonic band gap in the optimized planar diamond structure. Photonics. Nanostruct. Fundam. Appl. 1, 15 (2003)10.1016/S1569-4410(03)00002-6 ↗
4. Briant, C.L.: Tungsten: properties, processing, and applications. Adv. Mater. Process. 154, 29 (1998)
5. Doerner, M.F., Gardner, D.S., Nix, W.D.: Plastic properties of think films on substrates as measured by submicron indentation hardness and substrate curvature techniques. J. Mater. Res. 1(6), 845–851 (1987). doi: 10.1557/JMR.1986.084510.1557/JMR.1986.0845 ↗
6. El-Kady, I., Sigalas, M.M., Biswas, R., Ho, K.M., Soukoulis, C.M.: Metallic photonic crystals at optical wavelengths. Phys. Rev. B 62, 15299–15302 (2000). doi: 10.1103/PhysRevB.62.1529910.1103/PhysRevB.62.15299 ↗
7. El-Kady, I., Reda Taha, M.M., Su, M.: Application of photonic crystals in submicron damage detection and quantification. Appl. Phys. Lett. 88, 253109 (2006). doi: 10.1063/1.221205010.1063/1.2212050 ↗
8. Elmustafa, A.A., Ananda, A.A., Elmahboub, W.M.: Bilinear behavior in nano and microindentation tests of fcc polycrystalline materials. J. Eng. Mater. Technol. 126, 353–359 (2004). doi: 10.1115/1.178996210.1115/1.1789962 ↗
9. Gong, W., Wu, J., Guan, Z.: Load dependence of the apparent hardness of silicon nitride in a wide range of loads. Mater. Lett. 35, 58–61 (1998). doi: 10.1016/S0167-577X(97)00234-610.1016/S0167-577X(97)00234-6 ↗
10. Gorham, D.A., Pope, P.H., Field, J.E.: An improved method for compressive stress-strain measurements at very high strain rates. Proc. R. Soc. Lond. A Math. Phys. Sci. 438, 153–170 (1992)10.1098/rspa.1992.0099 ↗
11. Kunjomana, A.G., Chandrasekharan, K.A.: Microhardness studies of GaTe whiskers. Cryst. Res. Technol. 40, 782–785 (2005). doi: 10.1002/crat.20041043110.1002/crat.200410431 ↗
12. Lee, J.W., Kim, J.K., Kim, S.H., Sun, H.J., Yang, H.S., Sohn, H.C., et al.: Physical and electrical characteristics of physical vapor-deposited tungsten for bit line process. Jpn. J. Appl. Phys. 43(12), 8007–8012 (2004). doi: 10.1143/JJAP.43.800710.1143/JJAP.43.8007 ↗
13. Lin, S.Y., Flemming, J.G., Hetherington, D.L., Smith, B.K., Biswas, R., Ho, K.M., et al.: A three-dimensional photonic crystal operating at infrared wavelengths. Nature 394, 251 (1998). doi: 10.1038/2834310.1038/28343 ↗
14. Misra, A., Kung, H.: Deformation behavior of nanostructured metallic multilayers. Adv. Eng. Mater. 3, 217 (2001). doi:10.1002/1527-2648(200104)3:4<217::AID-ADEM217>3.0.CO;2-510.1002/1527-2648(200104)3:4<217::AID-ADEM217>3.0.CO;2-5 ↗
15. Paturaud, C., Farges, G., Sainte Catherine, M.C., Machet, J.: Correlation between hardness and embedded argon content of magnetron sputtered chromium films. Thin Solid Films 347, 46–55 (1999). doi: 10.1016/S0040-6090(98)01417-510.1016/S0040-6090(98)01417-5 ↗
16. Pauleau, Y., Dassapa, F.C., Lami, P., Oberlin, J.C., Romagna, F.: Silicide formation in metali/Si structures and diffusion barrier properties of CVD tungsten films. J. Mater. Res. 4(1), 156–162 (1989). doi: 10.1557/JMR.1989.015610.1557/JMR.1989.0156 ↗
17. Roy, R.A., Petkie, R., Boulding, A.: Properties and microstructure of tungsten films deposited by iron-assisted evaporation. J. Mater. Res. 6(1), 80–91 (1991). doi: 10.1557/JMR.1991.008010.1557/JMR.1991.0080 ↗
18. Schackelford, J.F.: Introduction to Materials Science for Engineers, 6th edn. New York (2005)
19. Sheyka, M.: Numerical and Experimental Investigation of Photonic Crystals as Sensors for Submicron Damage. M.Sc. Thesis, University of New Mexico, May (2008)
20. Stubičar, M., Tonejc, A., Radić, N.: Microhardness characterization of Al-W thin films. Vacuum 61, 309–316 (2001)10.1016/S0042-207X(01)00135-X ↗
21. Verley, J.C., Mani, S.S., Fleming, J.G., El-Kady, I., Khraishi, T., Reda Taha, M.M.: Experimental demonstration of using nanophotonic crystal sensor systems for submicron damage detection, quantification, and diagnoses. Proc. SPIE 6179, 617904 (2006). doi: 10.1117/12.65867610.1117/12.658676 ↗
22. Yih, S.W.H., Wang, C.T.: Tungsten: Sources, Metallurgy, Properties, and Applications. Plenum Press, New York (1979)10.1007/978-1-4899-5025-3 ↗
23. Yo-Han, Y., Woong, L., Hyunho, S.: Spherical nano-indentation of a hard thin film/soft substrate layered system: critical indentation depth. Model. Simul. Mater. Sci. Eng. 12, 59–67 (2004). doi: 10.1088/0965-0393/12/1/00610.1088/0965-0393/12/1/006 ↗
24. Young, J.F., Mindess, S., Gray, R.J., Bentur, A.: The Science and Technology of Civil Engineering Materials. Prentice-Hall Inc., New Jersey (1998)
25. Zong, Z., Lou, J., Adewoye, O.O., Elmustafa, A.A., Hammad, F., Soboyejo, W.O.: Indentation size effects in the nano- and micro-hardness of fcc single crystal metals. Mater. Sci. Eng. A 434, 178–187 (2006)10.1016/j.msea.2006.06.137 ↗