Low‐Temperature Sintering and Electrical Properties of 0.5Pb(Ni _1/3 Nb _2/3 )O ₃ ‐0.35PbTiO ₃ ‐0.15PbZrO ₃ Thick Films

The effect of sintering time on phase, grain size, dielectric, ferroelectric, and piezoelectric properties of 0.5Pb(Ni _1/3 Nb _2/3 )O ₃ ‐0.35PbTiO ₃ ‐0.15PbZrO ₃ thick films has been investigated. The thick films used in this study were fabricated by a double‐doctor‐blade tape‐casting technique. Green tapes were sintered at relatively low sintering temperature of 1050°C for 6, 8, 10, and 12 h. Among these, tapes sintered for 10 h were found to exhibit better electrical properties. Based on the obtained properties, prepared thick films could be categorized as soft piezoelectric materials and may be used for fabricating sensors, low‐power transducers, and actuators.