journal article·2020-11-03Open access

A Deep Learning Based Dislocation Detection Method for Cylindrical Crystal Growth Process

Jun Zhang, Hua Liu, Jianwei Cao, Weidong Zhu, Bo Jin, Wei Li

Applied Sciences· Volume 10· Issue 21

Abstract

For the single crystal furnace used in the photovoltaic industry, growth problems occur frequently due to dislocations during the shouldering and cylindrical growth steps of the Czochralski (CZ) crystal growth. Detecting the dislocation phenomenon in the cylindrical growth step is very important for entire automation of the CZ crystal furnace, since this process usually lasts for more than 48h. The irregular nature of different patterns of dislocation would impose a big challenge for a traditional machine vision-based detection method. As almost no publications have been dedicated to detecting this phenomenon, to address this issue, after analyzing the characteristics of the silicon ingot image of this process, this paper proposes a kind of deep learning-based dislocation detection method along with tracking strategy to simulate manual inspection. The model has a good detection effect whether there is occlusion or not, the experimental results show that the detection accuracy is 97.33%, and the inference speed is about 14.7 frames per second (FPS). It can achieve the purpose of reducing energy consumption and improving process automation by monitoring this process.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Industrial Vision Systems and Defect Detection · Silicon and Solar Cell Technologies · Image Processing Techniques and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Mechanical Engineering, Zhejiang University, Hangzhou 310027, China

Zhejiang Jingsheng Mechanical & Electrical Engineer Co., Ltd., Shaoxing 312300, China

References (17)

Show source-provided references
1. Temperature and Flow Visualization in a Simulation of the Czochralski Process Using Temperature-Sensitive Liquid Crystals10.1111/j.1749-6632.2002.tb04567.x ↗
2. Recent progress of crystal growth modeling and growth control10.1016/j.ces.2004.01.010 ↗
3. Fundamentals and Engineering of the Czochralski Growth of Semiconductor Silicon Crystals10.1016/B978-0-44-453153-7.00089-4 ↗
4. Characterization of the loss of the dislocation-free growth during Czochralski silicon pulling10.1016/j.jcrysgro.2016.10.077 ↗
5. Czochralski growth of silicon10.1016/0022-0248(83)90051-9 ↗
6. Krizhevsky, A., Sutskever, I., and Hinton, G.E. ImageNet classification with deep convolutional neural networks. Proceedings of the 25th International Conference on Neural Information Processing Systems, Lake Tahoe, Nevada. Available online: https://papers.nips.cc/paper/4824-imagenet-classification-with-deep-convolutional-neural-networks.pdf.
7. Tang, T., Zhou, S., Deng, Z., Zou, H., and Lei, L. (2017). Vehicle Detection in Aerial Images Based on Region Convolutional Neural Networks and Hard Negative Example Mining. Sensors, 17.10.3390/s17020336 ↗
8. Region-Based Convolutional Networks for Accurate Object Detection and Segmentation
9. Selective Search for Object Recognition10.1007/s11263-013-0620-5 ↗
10. Girshick, R. (2015, January 7–13). Fast R-CNN. Proceedings of the 2015 IEEE International Conference on Computer Vision (ICCV), Santiago, Chile.10.1109/ICCV.2015.169 ↗
11. Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks10.1109/TPAMI.2016.2577031 ↗
12. Zeiler, M., and Fergus, R. (2013). Visualizing and Understanding Convolutional Neural Networks, Springer.10.1007/978-3-319-10590-1_53 ↗
13. Simonyan, K., and Zisserman, A. (2014). Very Deep Convolutional Networks for Large-Scale Image Recognition. arXiv.
14. He, K., Zhang, X., Ren, S., and Sun, J. (2016, January 27–30). Deep Residual Learning for Image Recognition. Proceedings of the 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Las Vegas, NV, USA.10.1109/CVPR.2016.90 ↗
15. Flach, P.A. The Geometry of ROC Space: Understanding Machine Learning Metrics through ROC Isometrics. Proceedings of the Machine Learning, Twentieth International Conference, Washington, DC, USA. Available online: https://aaaipress.org/Papers/ICML/2003/ICML03-028.pdf.
16. The Pascal Visual Object Classes (VOC) Challenge10.1007/s11263-009-0275-4 ↗
17. Goyal, P., Dollár, P., Girshick, R., Noordhuis, P., Wesolowski, L., Kyrola, A., Tulloch, A., Jia, Y., and He, K. (2017). Accurate, Large Minibatch SGD: Training ImageNet in 1 Hour. arXiv.