article·2002-02-01

Temperature-induced metal–insulator transition on a triangular binary system: Sn/Si(111)

Joung Real Ahn, S. S. Lee, N. D. Kim, J.W. ChungRID ID Corresponding aut

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Abstract

WereportthatametallicSn/Si(111)- × R30° surface undergoes a metal–semiconductor transition upon annealing the surface above the transition temperature of 760 °C. The unique loss peak initially observed weakly from the metallic surfaces in our high-resolution electron-energy-loss spectra shifts gradually towards higher loss energy with increasing temperature. The peak eventually reaches 2.0 eV, revealing a band gap of about 1.2 eV at 810 °C. We find that a two-dimensional (2D) disordered alloy model, where the semiconducting surface is a 2D mixture of Sn and Si substitutions, is quite consistent with our experimental data.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Surface and Thin Film Phenomena · Electron and X-Ray Spectroscopy Techniques · Electronic and Structural Properties of Oxides

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