Determination of the impurity concentration in heavily doped inhomogeneous semiconductors from the measurement of the low-temperature conductivity
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Semiconductor materials and interfaces · Advanced Semiconductor Detectors and Materials · Phase-change materials and chalcogenides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (10)
Show source-provided references
1. N.F. Mott, M. Kaveh: Adv. Phys.34, 329 (1985)10.1080/00018738500101771 ↗
2. T.F. Rosenbaum, R.F. Milligan, M.A. Paalanen, G.A. Thomas, R.N. Batt, W. Lin: Phys. Rev. B27, 7509 (1983)10.1103/PhysRevB.27.7509 ↗
3. U. Thomanschefsky, D.F. Holcomb: Phys. Rev. B45, 13356 (1992)10.1103/PhysRevB.45.13356 ↗
4. H. Stupp, M. Hornung, M. Lakner, O. Madel, H. v. Lohneysen: Phys. Rev. Lett.71, 2634 (1993)10.1103/PhysRevLett.71.2634 ↗
5. W.N. Shafarman, D.W. Koon, T.G. Castner: Phys. Rev. B40, 1216 (1989)10.1103/PhysRevB.40.1216 ↗
6. P. Dai, Y. Zhang, M.P. Sarachik: Phys. Rev. B45, 3984 (1992)10.1103/PhysRevB.45.3984 ↗
7. H. Fritzsche: J. Phys. Chem. Solids6, 69 (1958)10.1016/0022-3697(58)90220-8 ↗
8. H. Fritzsche: Phys. Rev.125, 1552 (1962)10.1103/PhysRev.125.1552 ↗
9. S.M. Sze:Physics of Semiconductor Devices, 2nd edn. (Wiley, New York 1981) p. 33
10. I.S. Shlimak, L.I. Zarubin, A.N. Ionov, F.M. Vorobkalo, A.G. Zabrodskii, L. Yu Nemish: Sov Phys.-Tech. Phys. Lett.9, 377 (1983)