Influence of cationic stoichiometry of the bottom electrode La 1-x Sr x CoO 3 on the microstructures of Pb(Ta 0.05 Zr 0.48 Ti 0.47 )O 3 ferroelectric films using Pt/TiO 2 conducting barrier
Source abstract
Abstract
The heterostructures La1-xSrxCoO3/Pb(Ta0.05 Zr0.48Ti0.47)O3(PTZT)/La1-x SrxCoO3 have been deposited on SiO2/Si(001) substrates using Pt/TiO2 as conductive barrier by pulsed-laser deposition. La0.25Sr0.75CoO3(25/75) bottom electrodes with a pseudo-cubic perovskite structure favors (001)-textured growth of PTZT films. The ferroelectric capacitor LSCO(25/75)/PTZT/LSCO(25/75) remains about 96% of its polarization after 5×1010 switching cycles at an applied voltage of 5 V and a frequency of 500 kHz. The cross-section morphology of scanning electron microscopy and Rutherford backscattering spectra show that no obvious interdiffusion occurs across the interfaces.
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Research context
OpenAlex topics: Ferroelectric and Piezoelectric Materials · Electronic and Structural Properties of Oxides · Advancements in Solid Oxide Fuel Cells
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