journal article·1998-03-01

A low-temperature scanning near-field optical microscope for photoluminescence at semiconductor structures

I. Manke, D. Pahlke, J. Lorbacher, W. Busse, T. Kalka, W. Richter, M. Dähne-Prietsch

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Research context

OpenAlex topics: Near-Field Optical Microscopy · Quantum Dots Synthesis And Properties · Integrated Circuits and Semiconductor Failure Analysis

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