Simplified detection method of the rear-side weak soldering for monofacial solar cell using electroluminescence quantitative technology
Source abstract
Abstract
In the series soldering step of photovoltaic module manufacturing process, soldering could be occasionally found weak or missing between busbar and interconnection ribbon. The affected modules have local heating phenomenon in application, which aggravates modules efficiency degradation. Electroluminescence (EL) technology can detect many module defect types including weak soldering. But the grayscale change of EL image is not obvious enough caused by rear-side weak soldering (RWS) compared with front-side weak soldering, especially for monofacial solar cell. RWS is difficult for manual qualitative identification. In this paper, we use EL quantitative technology and simply define deviation percentage (Si) to distinguish types of weak soldering. RWS can be effectively detected through grayscale analysis of EL images under two different bias current conditions, which is verified by experiments and simulation. Further simulation results suggest that higher rear-side lateral resistance leads to lower Si of RWS. This method is instructive for the automatic EL detection in module production line.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Silicon and Solar Cell Technologies · solar cell performance optimization · Thin-Film Transistor Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (15)
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1. M. García, L. Marroyo, E. Lorenzo, J. Marcos, M. Pérez, Observed degradation in photovoltaic plants affected by hot-spots. Prog. Photovoltaics Res. Appl. 22, 1292–1301 (2014). https://doi.org/10.1002/pip.239310.1002/pip.2393 ↗
2. A. Anwar, Micro-crack detection of multicrystalline solar cells featuring an improved anisotropic diffusion filter and image segmentation technique.pdf. EURASIP J. Image Videc Process. (2014). https://doi.org/10.1186/1687-5281-2014-1510.1186/1687-5281-2014-15 ↗
3. T. Fuyuki, H. Kondo, Y. Kaji, A. Ogane, Y. Takahashi, Analytic findings in the electroluminescence characterization of crystalline silicon solar cells. J. Appl. Phys. 101(2), 023711 (2007). https://doi.org/10.1063/1.243107510.1063/1.2431075 ↗
4. T. Fuyuki, H. Kondo, T. Yamazaki, Y. Takahashi, Y. Uraoka, Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence. Appl. Phys. Lett. 10(1063/1), 1978979 (2005)
5. P. Würfel, T. Trupke, T. Puzzer, E. Schäffer, W. Warta, S.W. Glunz, Diffusion lengths of silicon solar cells from luminescence images. J. Appl. Phys. 10(1063/1), 2749201 (2007)
6. M. Glatthaar, J. Giesecke, M. Kasemann, J. Haunschild, M. The, W. Warta, S. Rein, Spatially resolved determination of the dark saturation current of silicon solar cells from electroluminescence images. J. Appl. Phys. 10(1063/1), 3132827 (2009)
7. T. Mochizuki, C. Kim, M. Yoshita, J. Mitchell, Z. Lin, S. Chen, H. Takato, Y. Kanemitsu, H. Akiyama, Solar-cell radiance standard for absolute electroluminescence measurements and open-circuit voltage mapping of silicon solar modules. J. Appl. Phys. 10(1063/1), 4940159 (2016)
8. V. Gazuz, C. Buerhop, Detection of power losses in busbar solder contacts by electroluminescence imaging of solar cells. Meas. Sci. Technol. (2011). https://doi.org/10.1088/0957-0233/22/11/11570210.1088/0957-0233/22/11/115702 ↗
9. J. Walter, D. Eberlein, J. Haunschild, M. Tranitz, U. Eitner (2012) A method to detect defective solder joints by RS-electroluminescence imaging. Paper presented at the energy procedia10.1016/j.egypro.2012.07.124 ↗
10. A.S. Rajput, C.D. Rodríguez-Gallegos, J.W. Ho, S. Nalluri, S. Raj, A.G. Aberle, J.P. Singh, Fast extraction of front ribbon resistance of silicon photovoltaic modules using electroluminescence imaging. Sol. Energy 194, 688–695 (2019). https://doi.org/10.1016/j.solener.2019.11.01310.1016/j.solener.2019.11.013 ↗
11. U. Rau, Reciprocity relation between photovoltaic quantum efficiency and electroluminescent emission of solar cells. Phys. Rev. B (2007). https://doi.org/10.1103/PhysRevB.76.08530310.1103/PhysRevB.76.085303 ↗
12. J. Haunschild, M. Glatthaar, M. Kasemann, S. Rein, E.R. Weber, Fast series resistance imaging for silicon solar cells using electroluminescence. Phys. Status Solidi Rapid Res. Lett. 3(7–8), 227–229 (2009)10.1002/pssr.200903175 ↗
13. M. Glatthaar, J. Haunschild, R. Zeidler, M. Demant, J. Greulich, B. Michl, W. Warta, S. Rein, R. Preu, Evaluating luminescence based voltage images of silicon solar cells. J. Appl. Phys. 10(1063/1), 3443438 (2010)
14. K.G. Bedrich, W. Luo, M. Pravettoni, D. Chen, Y. Chen, Z. Wang, P.J. Verlinden, P. Hacke, Z. Feng, J. Chai, Y. Wang, A.G. Aberle, Y.S. Khoo, Quantitative electroluminescence imaging analysis for performance estimation of PID-influenced PV modules. IEEE J. Photovolt. 8(5), 1281–1288 (2018). https://doi.org/10.1109/jphotov.2018.284666510.1109/jphotov.2018.2846665 ↗
15. S. Guo, J.P. Singh, M. Peters, A.G. Aberle, J. Wong, Two-dimensional current flow in stringed PV cells and its influence on the cell-to-module resistive losses. Sol. Energy 130, 224–231 (2016). https://doi.org/10.1016/j.solener.2016.02.01210.1016/j.solener.2016.02.012 ↗