Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy
Source abstract
Abstract
We present a detailed study of compressively strained Pb x Sr 1-x TiO 3 thin films grown by off-axis radio frequency magnetron sputtering on (001)-oriented Nb-doped SrTiO 3 substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thickness and compared with a phenomenological Landau-Devonshire model. 180 ferroelectric domains are observed using both X-ray diffraction and piezoresponse force microscopy and domain sizes obtained by the two techniques are compared and discussed.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Ferroelectric and Piezoelectric Materials · Electronic and Structural Properties of Oxides · Acoustic Wave Resonator Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
DQMP, University of Geneva, 24 Quai E. Ansermet, 1211 Geneva 4, Switzerland
London Centre for Nanotechnology and Department of Physics and Astronomy, University College London, 17–19 Gordon Street, London WC1H 0HA, United Kingdom
Funding
European Research Council (ERC) · Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung (SNF)
References (53)
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