journal article·2007-08-01

Electron Holography: Phase Imaging with Nanometer Resolution

Martha R. McCartney, David J. Smith

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Abstract

Electron holography provides a unique phase-imaging approach for characterizing nanoscale electrostatic and magnetic fields. From the relative phase shifts of the electron wave that has passed through the sample, quantitative field measurements that can be related back to specific features of the object can be made. The basic theory and experimental geometry for the off-axis mode of electron holography are first presented. Representative studies over a wide range of materials are then described. Applications involving electrostatic fields include p-n junctions and dopant profiles, piezoelectric fields and ferroelectrics, and charged defects and boundaries. Applications involving magnetic materials include hard magnets, thin films, and nanostructures, both man-made and naturally occurring. Finally, prospects for future developments and applications are briefly discussed.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Force Microscopy Techniques and Applications · Microstructure and mechanical properties

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Physics, Arizona State University, Tempe, Arizona, 85287-1504;,

References (100+)

Show source-provided references
1. 10.1016/B978-0-12-029912-6.50006-310.1016/B978-0-12-029912-6.50006-3 ↗
2. 10.1080/0001873920010147310.1080/00018739200101473 ↗
3. 10.1098/rspa.1949.007510.1098/rspa.1949.0075 ↗
4. 10.1038/3382310.1038/33823 ↗
5. 10.1063/1.36561010.1063/1.365610 ↗
6. Tonomura A · J. Electron Microsc. · 1979 · 28 · 1
7. 10.1103/RevModPhys.59.63910.1103/RevModPhys.59.639 ↗
8. 10.1016/0968-4328(95)00054-810.1016/0968-4328(95)00054-8 ↗
9. 10.1016/0304-3991(93)90196-510.1016/0304-3991(93)90196-5 ↗
10. 10.1007/978-1-4615-4817-1_510.1007/978-1-4615-4817-1_5 ↗
11. 10.1016/0304-3991(93)90197-610.1016/0304-3991(93)90197-6 ↗
12. Reimer L · 1991
13. 10.1016/S0304-3991(98)00023-010.1016/S0304-3991(98)00023-0 ↗
14. 10.1016/S1044-5803(99)00019-410.1016/S1044-5803(99)00019-4 ↗
15. 10.1016/S0304-3991(00)00042-510.1016/S0304-3991(00)00042-5 ↗
16. 10.1063/1.34897010.1063/1.348970 ↗
17. 10.1093/jmicro/54.3.23910.1093/jmicro/54.3.239 ↗
18. 10.1016/0304-3991(92)90213-410.1016/0304-3991(92)90213-4 ↗
19. 10.1063/1.35665810.1063/1.356658 ↗
20. 10.1007/978-1-4615-4817-1_410.1007/978-1-4615-4817-1_4 ↗
21. 10.1103/PhysRevLett.74.39910.1103/PhysRevLett.74.399 ↗
22. 10.1088/0022-3735/14/6/00110.1088/0022-3735/14/6/001 ↗
23. 10.1063/1.36605710.1063/1.366057 ↗
24. Hirayama T · J. Electron Microsc. · 1994 · 43 · 190
25. 10.1016/S0304-3991(96)00068-X10.1016/S0304-3991(96)00068-X ↗
26. 10.1016/S0304-3991(02)00260-710.1016/S0304-3991(02)00260-7 ↗
27. 10.1016/0304-3991(94)90040-X10.1016/0304-3991(94)90040-X ↗
28. 10.1016/0304-3991(94)90041-810.1016/0304-3991(94)90041-8 ↗
29. Gajdardziska-Josifovska M · Interface Sci. · 1994 · 2 · 425
30. 10.1016/0304-3991(93)90198-710.1016/0304-3991(93)90198-7 ↗
31. 10.1016/0304-3991(93)90130-P10.1016/0304-3991(93)90130-P ↗
32. 10.1007/978-1-4615-4817-1_610.1007/978-1-4615-4817-1_6 ↗
33. 10.1016/S0304-3991(96)00075-710.1016/S0304-3991(96)00075-7 ↗
34. Banzhof H · Electron Microscopy 1998 · 1998 · 1 · 559
35. 10.1046/j.1365-2818.2000.00753.x10.1046/j.1365-2818.2000.00753.x ↗
36. Dunin-Borkowski RE · 2004 · 3 · 41
37. 10.1116/1.163877510.1116/1.1638775 ↗
38. 10.1103/PhysRevLett.82.261410.1103/PhysRevLett.82.2614 ↗
39. 10.1103/PhysRevLett.89.02550210.1103/PhysRevLett.89.025502 ↗
40. 10.1016/0040-6090(79)90375-410.1016/0040-6090(79)90375-4 ↗
41. 10.1103/PhysRevLett.55.219610.1103/PhysRevLett.55.2196 ↗
42. 10.1016/0304-3991(87)90224-510.1016/0304-3991(87)90224-5 ↗
43. 10.1063/1.11258110.1063/1.112581 ↗
44. 10.1109/IEDM.1998.74645610.1109/IEDM.1998.746456 ↗
45. 10.1063/1.147370210.1063/1.1473702 ↗
46. 10.1002/1521-3951(200011)222:1<213::AID-PSSB213>3.0.CO;2-H10.1002/1521-3951(200011)222:1<213::AID-PSSB213>3.0.CO;2-H ↗
47. 10.1017/S143192760606035110.1017/S1431927606060351 ↗
48. 10.1016/j.ultramic.2005.09.00310.1016/j.ultramic.2005.09.003 ↗
49. Dunin-Borkowski RE · 2000 · 3 · 163
50. 10.1016/j.ultramic.2004.11.01810.1016/j.ultramic.2004.11.018 ↗
51. 10.1093/jmicro/dfi05510.1093/jmicro/dfi055 ↗
52. Twitchett AC, Dunin-Borkowski RE, Midgley PA. 2002. Quantitative electron holography of biased semiconductor devices. Phys. Rev. Lett. 88:23830210.1103/PhysRevLett.88.238302 ↗
53. 10.1088/0953-8984/16/2/02110.1088/0953-8984/16/2/021 ↗
54. 10.1111/j.0022-2720.2004.01328.x10.1111/j.0022-2720.2004.01328.x ↗
55. 10.1017/S143192760505008710.1017/S1431927605050087 ↗
56. 10.1016/j.ultramic.2005.11.00210.1016/j.ultramic.2005.11.002 ↗
57. 10.1093/jmicro/50.6.47910.1093/jmicro/50.6.479 ↗
58. 10.1109/TED.2003.81346710.1109/TED.2003.813467 ↗
59. 10.1016/S1386-9477(03)00302-310.1016/S1386-9477(03)00302-3 ↗
60. 10.1063/1.146771210.1063/1.1467712 ↗
61. 10.1017/S143192760404003610.1017/S1431927604040036 ↗
62. 10.1109/TED.2005.84812310.1109/TED.2005.848123 ↗
63. 10.1007/978-3-642-58562-310.1007/978-3-642-58562-3 ↗
64. 10.1016/S0022-0248(01)01243-X10.1016/S0022-0248(01)01243-X ↗
65. 10.1063/1.147760210.1063/1.1477602 ↗
66. 10.1002/1521-396X(200112)188:2<833::AID-PSSA833>3.0.CO;2-B10.1002/1521-396X(200112)188:2<833::AID-PSSA833>3.0.CO;2-B ↗
67. 10.1063/1.181537610.1063/1.1815376 ↗
68. 10.1063/1.168940010.1063/1.1689400 ↗
69. 10.1063/1.12657710.1063/1.126577 ↗
70. 10.1016/0304-3991(93)90132-H10.1016/0304-3991(93)90132-H ↗
71. Zhang X · MSA Bull. · 1994 · 24 · 515
72. 10.1016/S0304-3991(02)00277-210.1016/S0304-3991(02)00277-2 ↗
73. 10.1016/0304-3991(94)00169-N10.1016/0304-3991(94)00169-N ↗
74. 10.1002/1521-396X(200208)192:2<407::AID-PSSA407>3.0.CO;2-M10.1002/1521-396X(200208)192:2<407::AID-PSSA407>3.0.CO;2-M ↗
75. 10.1103/PhysRevLett.87.20550410.1103/PhysRevLett.87.205504 ↗
76. 10.1093/jmicro/51.2.10510.1093/jmicro/51.2.105 ↗
77. 10.1002/1521-3951(200212)234:3<924::AID-PSSB924>3.0.CO;2-810.1002/1521-3951(200212)234:3<924::AID-PSSB924>3.0.CO;2-8 ↗
78. 10.1016/j.mssp.2006.01.04710.1016/j.mssp.2006.01.047 ↗
79. 10.1103/PhysRevB.73.24531610.1103/PhysRevB.73.245316 ↗
80. 10.1063/1.156568710.1063/1.1565687 ↗
81. 10.1063/1.12314910.1063/1.123149 ↗
82. 10.1103/PhysRevLett.75.406310.1103/PhysRevLett.75.4063 ↗
83. 10.1080/0950083021014646110.1080/09500830210146461 ↗
84. 10.1063/1.12318410.1063/1.123184 ↗
85. 10.1017/S143192769999049910.1017/S1431927699990499 ↗
86. 10.1023/A:100870690861410.1023/A:1008706908614 ↗
87. 10.1103/PhysRevB.67.22451210.1103/PhysRevB.67.224512 ↗
88. Saito R · 1999
89. 10.1103/PhysRevLett.88.05680410.1103/PhysRevLett.88.056804 ↗
90. 10.1088/0022-3727/17/4/00310.1088/0022-3727/17/4/003 ↗
91. 10.1017/S143192769797012410.1017/S1431927697970124 ↗
92. 10.1103/PhysRevLett.56.79210.1103/PhysRevLett.56.792 ↗
93. 10.1103/PhysRevLett.70.295210.1103/PhysRevLett.70.2952 ↗
94. 10.1063/1.12106010.1063/1.121060 ↗
95. 10.1063/1.36791610.1063/1.367916 ↗
96. 10.1063/1.36851510.1063/1.368515 ↗
97. 10.1016/S0304-8853(01)00699-010.1016/S0304-8853(01)00699-0 ↗
98. 10.1063/1.182938210.1063/1.1829382 ↗
99. 10.1063/1.11763710.1063/1.117637 ↗
100. 10.1016/S1359-6454(02)00431-710.1016/S1359-6454(02)00431-7 ↗