Fast three-dimensional point cloud registration algorithm based on plane and curvature parameters
Source abstract
Abstract
The rapid generation of three-dimensional (3D) imaging has improved the safety and operational efficiency of advanced driver assistance systems and mobile robotics technologies. To expedite the stitching process for 3D point cloud data, this study proposes and validates a method that combines coarse registration based on planarity and fine registration based on curvature features. Multiple 3D scenes were collected in the experiments, and the runtime performance was systematically analyzed. Compared with the ICP algorithm, the improved algorithm achieves faster registration speed, with improvements of 19.7% in the cabinet scene, 86.6% in the pig zodiac doll scene, and 61.9% in the tellurion scene. Moreover, the increased efficiency is achieved with negligible impact on the matching residuals. Processing point cloud data without planar information posed challenges in terms of efficiency; however, a notable improvement in processing speed was observed, with point cloud data containing planar scenes. It is important for applications related to 3D imaging registration.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Robotics and Sensor-Based Localization · 3D Shape Modeling and Analysis · Soft Robotics and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Nanjing University, School of Electronic Science and Engineering 1 , No. 163 Xianlin Avenue, Qixia District, Nanjing 210023,
Wanjiang University of Technology, School of Electrical Information Engineering 2 , No. 333 Huolishan Avenue, Yushan District, Maanshan 243001,
Hangzhou Innovation Institute of Beihang University, Platform of Millimeter Wave Sensing and Intelligent Monitoring 3 , No. 99 Juhang Lane, Changhe Street, Binjiang Disrtrict, Hangzhou 310052,
Funding
Scientific Research Program of Anhui Provincial Department of Education
References (30)
Show source-provided references
1. 1990 · 616
2. Egypt. J. Forensic Sci. · 2020 · 10 · 310.1186/s41935-020-0181-z ↗
3. Fractals · 2023 · 31 · 234007410.1142/S0218348X23400741 ↗
4. ACM Comput. Surv. · 2023 · 55 · 110.1145/3560884 ↗
5. IEEE Trans. Intell. Transp. Syst. · 2023 · 25 · 114810.1109/TITS.2023.3317372 ↗
6. IEEE Trans. Intell. Veh. · 2023 · 9 · 59310.1109/TIV.2023.3312777 ↗
7. IEEE Sens. J. · 2023 · 23 · 806010.1109/jsen.2023.3251661 ↗
8. Inf. Fusion · 2021 · 68 · 16110.1016/j.inffus.2020.11.002 ↗
9. Int. J. Comput. Vision · 2023 · 131 · 190910.1007/s11263-023-01790-1 ↗
10. IEEE Trans. Pattern Anal. Mach. Intell. · 1992 · 14 · 23910.1109/34.121791 ↗
11. IEEE Trans. Intell. Veh. · 2022 · 8 · 169910.1109/TIV.2022.3213796 ↗
12. Remote Sens. · 2024 · 16 · 197910.3390/rs16111979 ↗
13. 2002 · 91
14. IEEE Signal Process. Lett. · 2025 · 32 · 76610.1109/LSP.2025.3535221 ↗
15. 2021 · 11054
16. IEEE Trans. Pattern Anal. Mach. Intell. · 2022 · 45 · 581610.1109/TPAMI.2022.3214191 ↗
17. IEEE Rob. Autom. Lett. · 2022 · 7 · 788810.1109/lra.2022.3185782 ↗
18. IEEE Trans. Image Process. · 2024 · 33 · 652110.1109/tip.2024.3494555 ↗
19. IEEE Trans. Pattern Anal. Mach. Intell. · 1992 · 14 · 15710.1109/34.121787 ↗
20. IEEE Trans. Image Process. · 2021 · 30 · 622610.1109/tip.2021.3093380 ↗
21. IEEE Trans. Intell. Transp. Syst. · 2022 · 23 · 2286210.1109/tits.2022.3195555 ↗
22. Sensors · 2023 · 23 · 221310.3390/s23042213 ↗
23. IEEE Trans. Network Sci. Eng. · 2024 · 11 · 471910.1109/tnse.2024.3395710 ↗
24. Opt. Lasers Eng. · 2025 · 186 · 10882010.1016/j.optlaseng.2025.108820 ↗
25. 3D Res. · 2011 · 2 · 310.1007/3DRes.02(2011)3 ↗
26. IEEE Trans. Pattern Anal. Mach. Intell. · 2023 · 45 · 1136510.1109/tpami.2023.3269202 ↗
27. IEEE Trans. Image Process. · 2022 · 31 · 184110.1109/tip.2022.3148822 ↗
28. Pattern Recognit. · 2015 · 48 · 204310.1016/j.patcog.2014.12.020 ↗
29. Measurement · 2021 · 177 · 10927410.1016/j.measurement.2021.109274 ↗
30. J. Electr. Eng. Technol. · 2024 · 19 · 358710.1007/s42835-023-01641-6 ↗