journal article·2026-02-01Open access

Effect of nanosilicon coating on the EUV/x-ray reflectance of silica polycapillary optic

Munir H. Nayfeh, Zain Yamani, Jiacheng Xu, Dmitry Gorin, Julia Skibina, Haichuan Yu, Hakan Ates, Ersin Bahceci, Mete Bakir, Bulent Aydogan

AIP Advances· Volume 16· Issue 2

Abstract

Reflection-based lensing is used to focus or collimate extreme ultraviolet (EUV)/x rays (x-ray optics) propagating in grazing incidence small-angle x-ray scattering (GISAXS) inside poly-capillary glass. In the process, the refractive index of silica is slightly less than that of vacuum (1.0) for EUV/x rays, leading to total external reflection with a critical angle slightly less than 90°. Here, we examine the feasibility of widening the total external reflection window by coating the capillary interior surface with a silicon nanofilm that assumes the shape of the polycapillary, which may enhance the collection and collimation power. We use slow dynamic self-assembly via circulation of the nanoparticles through the capillary. Electromagnetic scattering computations are conducted using the model of a flat glass substrate decorated with closely packed Si nanoparticles. Optical, luminescent, and SEM imaging techniques, as well as spectroscopy, show that the polycapillary coating is uniform and luminescent under UV irradiation. The computations show that, for visible wavelengths, a 3 nm silicon nanoparticle film reduces the grazing reflectivity at the visible/UV band-to-band transitions E1 and E2. For EUV/x ray, there is a significant reflectivity enhancement of ∼10% due to a larger index dip below that of vacuum, affording a smaller critical angle. Widening the external reflection regime promises superior collection and focusing power, improving the intensity and resolution. Being luminescent under UV makes it useful for imaging, therapy, and other clinical procedures, while also enabling the development of more compact and versatile instruments.
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Research context

OpenAlex topics: Advanced X-ray Imaging Techniques · X-ray Spectroscopy and Fluorescence Analysis · Crystallography and Radiation Phenomena

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Physics, University of Illinois at Urbana-Champaign 1 , Urbana, Illinois 61801,

Department of Physics, KFUPM 2 , Dhahran,

Department of Psychological and Brain Sciences, Dartmouth College 3 , Hanover, New Hampshire 03755,

Center of Photonics and Quantum Materials (CPQM), Skolkovo Institute of ST 4 , Moscow,

Saratov State University and SPE Nanostructured Glass Technology Ltd. 5 , Saratov,

Harvard Business School 6 , Cambridge, Massachusetts 02163,

Material Science and Engineering, Gazi University 7 , Ankara,

Metallurgical and Materials Engineering, Iskenderun Technical University 8 , Iskenderun, Hatay,

Aviation and Aerospace Component Manufacturing, Turkish Aerospace 9 , Ankara,

Department of Radiation and Cellular Oncology, University of Chicago 10 , Chicago, Illinois 60637,

Funding

University of Illinois at Urbana-Champaign

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