Determination of the reflectivity of crystals by ptychography
Source abstract
Abstract
The x-ray reflectivity of crystals is an important measure for their quality. Its knowledge is of interest for the development of materials as well as for the design of x-ray optical instruments, while the determination of the reflectivity curve is not trivial. This article presents an approach to retrieve the reflectivity curve of crystals based on ptychography. The method is demonstrated on the examples of silicon and diamond of which the reconstructed reflectivity curves agree well with theoretical expectations. Thus, this method offers promising perspectives in the detection of small crystalline defects and in the design of future instruments for x rays.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Advanced X-ray Imaging Techniques · High-pressure geophysics and materials · Crystallography and Radiation Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Helmholtz-Institut Jena, 07743 Jena, Germany; Friedrich-Schiller-Universität Jena, 07743 Jena, Germany; and GSI Helmholtzzentrum für Schwerionenforschung , 64291 Darmstadt, Germany
Funding
Deutsche Forschungsgemeinschaft
References (28)
Show source-provided references
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