journal article·2017-12-01Open access

Theoretical and experimental study of the dark signal in CMOS image sensors affected by neutron radiation from a nuclear reactor

Yuanyuan Xue, Zujun Wang, Baoping He, Zhibin Yao, Minbo Liu, Wuying Ma, Jiangkun Sheng, Guantao Dong, Junshan Jin

AIP Advances· Volume 7· Issue 12

Abstract

The CMOS image sensors (CISs) are irradiated with neutron from a nuclear reactor. The dark signal in CISs affected by neutron radiation is studied theoretically and experimentally. The Primary knock-on atoms (PKA) energy spectra for 1 MeV incident neutrons are simulated by Geant4. And the theoretical models for the mean dark signal, dark signal non-uniformity (DSNU) and dark signal distribution versus neutron fluence are established. The results are found to be in good agreement with the experimental outputs. Finally, the dark signal in the CISs under the different neutron fluence conditions is estimated. This study provides the theoretical and experimental evidence for the displacement damage effects on the dark signal CISs.
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Research context

OpenAlex topics: CCD and CMOS Imaging Sensors · Infrared Target Detection Methodologies · Advanced Semiconductor Detectors and Materials

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Affiliations

State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology , P.O.Box 69-10, Xi’an, Shaanxi 710024, China

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