Thermistors and stacked thermopile on III-nitride LED wafer and their application for on-chip temperature measurement
Source abstract
Abstract
Temperature measurement of devices in working state is of critical importance. In this work, GaN-based thermistors and a thermopile are monolithically integrated with a III-nitride blue light-emitting diode (LED) for the on-chip temperature measurement of the LED. The thermistor is based on the temperature-dependent resistance, and the stacked thermopile is based on the Seebeck effect. The measured results indicate that both thermistors and the thermopile can monitor the temperature of the LED sensitively. Due to the advantages of higher sensitivity and easier signal processing, the thermopile is more suitable for real-time monitoring.
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Research context
OpenAlex topics: GaN-based semiconductor devices and materials · Gas Sensing Nanomaterials and Sensors · Advanced MEMS and NEMS Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
College of Intelligent Manufacturing, Nanjing Polytechnic Institute 1 , Nanjing 210044,
School of Communication and Information Engineering, Nanjing University of Posts and Telecommunications 2 , Nanjing 210003,
Funding
Natural Science Foundation of Nanjing University of Posts and Telecommunications · General Project of Philosophy and Social Science Research in Universities of Jiangsu Province in 2022
References (19)
Show source-provided references
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