journal article·2024-01-01Open access

Simulation of proton-induced primary displacement damage in GaAs under different ambient temperatures

Tian Xing, Shuhuan Liu, Ci Song, Xuan Wang, Mathew Adefusika Adekoya, Chao Wang, Haodi Li, Fanjun Meng, Xiaozhi Du, Yunfeng Sun, Shijie Zhu, Lipeng Wang, Wei Chen, Kang Li, Xiaohai Zheng

AIP Advances· Volume 14· Issue 1

Abstract

The performance of on-orbit GaAs-based solar cells is susceptible to the displacement damage effect. The proton-induced primary displacement damage in GaAs on a geosynchronous equatorial orbit (GEO) was simulated and analyzed by combining the Monte Carlo (MC) and molecular dynamics (MD) methods. The MC simulation provided the distribution of primary knock-on atoms (PKAs) in GaAs induced by GEO-related protons to the MD simulation. In MD simulations, the effects of radiation fluence and ambient temperature on the displacement damage were considered. The simulation results showed that GEO-related protons generated a significant number of PKAs within an energy range of below 10 keV in GaAs. The high-fluence radiation emulated by the binary PKA could generate more point defects and cluster defects in GaAs than the low-fluence radiation emulated by single PKAs. As compared to room temperature (300 K), both a low (100 K) and high (500 K) ambient temperature could deteriorate the displacement damage. In addition, a high ambient temperature of 500 K could induce widespread thermal spikes in GaAs as compared to 100 and 300 K. This work can provide useful insight into the proton-induced displacement damage in GaAs and the radiation hardening of GaAs-based photoelectric devices in space.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Radiation Effects in Electronics · Silicon and Solar Cell Technologies · Advanced Semiconductor Detectors and Materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Nuclear Science and Technology, Xi’an Jiaotong University 1 , Xi’an 710049, China

State Key Lab of Electrical Insulation and Power Equipment, Xi’an Jiaotong University 2 , Xi’an 710049, China

Northwest Institute of Nuclear Technology 3 , Xi’an 710024, China

Xi’an Guanneng Neutron Detection Technology Co., Ltd. 4 , Xi’an 710123, China

References (25)

Show source-provided references
1. Displacement damage and predicted non-ionizing energy loss in GaAs10.1063/1.4977861 ↗
2. The influence of temperature and energy on defect evolution and clustering during cascade in GaAs10.1016/j.nimb.2021.07.003 ↗
3. Radiation effects in ultra-thin GaAs solar cells10.1063/5.0103381 ↗
4. Primary radiation damage: A review of current understanding and models10.1016/j.jnucmat.2018.10.027 ↗
5. Analysis of displacement damage mechanism and simulation proton irradiation on GaAs10.1063/5.0104457 ↗
6. Insight of displacement cascade evolution in gallium arsenide through molecular dynamics simulations10.1016/j.commatsci.2021.111016 ↗
7. Effect of electronic stopping in molecular dynamics simulations of collision cascades in gallium arsenide10.1103/PhysRevMaterials.7.025404 ↗
8. Proton nonionizing energy loss (NIEL) for device applications10.1109/TNS.2003.820760 ↗
9. Molecular dynamics simulations of displacement damage in SiGe alloys induced by single and binary primary knock-on atoms under different temperatures10.1080/10420150.2023.2253483 ↗
10. Recent developments in Geant410.1016/j.nima.2016.06.125 ↗
11. Geant4 developments and applications10.1109/TNS.2006.869826 ↗
12. Geant4—A simulation toolkit10.1016/S0168-9002(03)01368-8 ↗
13. Simulation of single particle displacement damage in silicon—Part I: Global approach and primary interaction simulation10.1109/TNS.2016.2615133 ↗
14. Application of displacement damage dose approach to low-energy proton irradiated GaInP/GaAs/Ge solar cells10.1016/j.nimb.2023.165144 ↗
15. LAMMPS—A flexible simulation tool for particle-based materials modeling at the atomic, meso, and continuum scales10.1016/j.cpc.2021.108171 ↗
16. Modeling of compound semiconductors: Analytical bond-order potential for Ga, As, and GaAs10.1103/PhysRevB.66.035205 ↗
17. Molecular dynamics simulation of displacement damage in 6H-SiC10.1080/10420150.2019.1649260 ↗
18. Thermal effects in 10keV Si PKA cascades in 3C–SiC10.1016/j.jnucmat.2009.01.036 ↗
19. Electronic stopping in molecular dynamics simulations of cascades in 3C–SiC10.1016/j.jnucmat.2020.152371 ↗
20. Molecular dynamics simulation of displacement cascades in cubic silicon carbide10.1016/j.nme.2021.100957 ↗
21. Comprehensive approach to determination of space proton-induced displacement defects in silica optical fiber10.1016/j.nimb.2021.06.014 ↗
22. Primary damage of 10 keV Ga PKA in bulk GaN material under different temperatures10.1016/j.net.2019.12.027 ↗
23. Probing the displacement damage mechanism in Si, Ge, GaAs by defects evolution analysis10.1016/j.commatsci.2021.111084 ↗
24. Defect clustering during ion irradiation of GaAs: Insight from molecular dynamics simulations10.1063/1.1384856 ↗
25. Displacement cascades in monocrystalline silicon: Effects of temperature, strain, and PKA energy10.1080/00295450.2019.1613850 ↗