Numerical simulation of outgassing characteristics of microchannel plate glass

Outgassing of internal materials is one of the main factors that cause vacuum deterioration of low-light-level image intensifiers and shorten their lifetime (especially storage lifetime). To perceive the attenuation mechanism of the vacuum degree of image intensifiers from the microscopic view, the outgassing characteristics of lead silicate glass used for the fabrication of microchannel plates (MCPs), which are the core components of image intensifiers, were numerically simulated by giant canonical Monte Carlo and molecular dynamics methods. A glass structure model of the third-generation MCPs was constructed, and the diffusion coefficients and molecular motion trajectories of hydrogen, carbon dioxide, carbon monoxide, water vapor, oxygen, and methane gases, together with their outgassing rates and cumulative outgassing amounts, were calculated based on the condensed-phase optimized molecular potentials for atomistic simulation studies force field. The calculation results show that the rising temperature of MCP glass augments the diffusion coefficients of these gases, which makes the outgassing rates increase in the initial stage but then decrease relatively quickly. Among these six kinds of gas molecules, hydrogen molecules have the largest skip distance and the highest diffusion coefficient because MCP glass can supply more effective diffusion paths for the gas molecules with a relatively small size. When an MCP glass lies in vacuum, first, the cumulative outgassing amounts of various gases from it increase rapidly and then gradually reach stable values, and the cumulative outgassing amount of hydrogen tends to reach a stable value faster than that of other gases due to its highest diffusion coefficient.