External noise-induced transitions in a current-biased Josephson junction
Source abstract
Abstract
We investigate noise-induced transitions in a current-biased and weakly damped Josephson junction in the presence of multiplicative noise. By using the stochastic averaging procedure, the averaged amplitude equation describing dynamic evolution near a constant phase difference is derived. Numerical results show that a stochastic Hopf bifurcation between an absorbing and an oscillatory state occurs. This means the external controllable noise triggers a transition into the non-zero junction voltage state. With the increase of noise intensity, the stationary probability distribution peak shifts and is characterised by increased width and reduced height. And the different transition rates are shown for large and small bias currents.
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Research context
OpenAlex topics: stochastic dynamics and bifurcation · Advancements in Semiconductor Devices and Circuit Design · Quantum and electron transport phenomena
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Affiliations
Yancheng Institute of Technology 1 School of Mathematics and Physics, , Yancheng 224051, PR China
Hunan University 2 College of Mechanical and Vehicle Engineering, , Changsha 410082, PR China
References (10)
Show source-provided references
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