Ion trap with gold-plated alumina: Substrate and surface characterization
Source abstract
Abstract
We describe a complete development process of a segmented-blade linear ion trap. An alumina substrate is characterized with an x-ray diffraction and loss-tangent measurement. The blade is laser-micromachined and polished, followed by sputtering and gold electroplating. Surface roughness is examined at each step of the fabrication via both electron and optical microscopies. On the gold-plated facet, we obtain a height deviation of tens of nanometers in the vicinity of the ion position. Trapping of laser-cooled 174Yb+ ions is demonstrated.
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Research context
OpenAlex topics: Diamond and Carbon-based Materials Research · Atomic and Molecular Physics · Mass Spectrometry Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH) 1 , 37673 Pohang, South Korea
Department of Physics, Pohang University of Science and Technology (POSTECH) 2 , 37673 Pohang, South Korea
Pohang Accelerator Laboratory (PAL), Pohang University of Science and Technology (POSTECH) 3 , 37673 Pohang, South Korea
Funding
National Research Foundation of Korea · Institute for Information and Communications Technology Promotion · Samsung Science and Technology Foundation · Samsung Electronics Co., Ltd.
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