journal article·2017-09-01Open access

Surface aging effects of long-term energized conductors on spectrum characteristics of audible noise

Y. Yi, Z. Y. Chen, L. M. Wang

AIP Advances· Volume 7· Issue 9

Abstract

The impact of surface aging level of long-term energized conductors on spectrum characteristics of audible noise is studied in this paper. It is found that the average roughness and root-mean-square roughness of conductors increase with the operating time, namely the aging degree, through the quantitative measurement. A-weighted equivalent continuous sound pressure level (LAeq) is found to increase with the aging level. As the aging aggravation, the LAeq and its high-frequency components (>1 kHz) increase substantially and high-frequency components are mainly contributing to the increasing of LAeq. The high-frequency components (>1 kHz) of the new and aged stranded conductors have a marked increasing trend as the surface potential gradient increases, while the low-frequency components are mainly environment noise.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Aerosol Filtration and Electrostatic Precipitation · High voltage insulation and dielectric phenomena · Thermal Analysis in Power Transmission

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Tsinghua-Berkeley Shenzhen Institute, Tsinghua University 1 , Shenzhen 518055, China

Graduate School at Shenzhen, Tsinghua University 2 , Shenzhen 518055, China

Funding

National Key Research and Development Program of China · National Natural Science Foundation of China

References (16)

Show source-provided references
1. 2011
2. Appl. Phys. Lett. · 2011 · 98 · 09150410.1063/1.3559850 ↗
3. Appl. Phys. Lett. · 2011 · 98 · 05150410.1063/1.3551544 ↗
4. IEEE. Trans. PAS · 1975 · 94 · 59110.1109/t-pas.1975.31887 ↗
5. IEEE. Trans. PAS · 1977 · 96 · 31210.1109/t-pas.1977.32339 ↗
6. IEEE. Trans. PAS · 1976 · 95 · 110510.1109/t-pas.1976.32203 ↗
7. IEEE. Trans. · 1979 · PAS 98 · 56110.1109/tpas.1979.319406 ↗
8. IEEE. Trans. · 1974 · PAS 93 · 83110.1109/tpas.1974.293982 ↗
9. IEEE. Trans. PAS · 1975 · 94 · 111710.1109/t-pas.1975.31946 ↗
10. J. Europ. Phys.: Appl. Phys. · 2001 · 15 · 5710.1051/epjap:2001167 ↗
11. J. Acoust. Soc. Am · 2007 · 121 · 1961
12. Appl. Phys. Lett. · 2001 · 2646 · 091504
13. IEEE Trans. Power Del · 2012 · 27 · 40110.1109/tpwrd.2011.2172003 ↗
14. Appl. Phys. Lett. · 2012 · 101 · 17410310.1063/1.4764016 ↗
15. IEEE Trans. Dielectr. Electr. Insul. · 2012 · 19 · 203710.1109/tdei.2012.6396963 ↗
16. IEEE Trans. Dielectr. Electr. Insul. · 2015 · 22 · 131510.1109/tdei.2015.7076836 ↗