journal article·2020-04-01Open access

Counter-intuitive junction temperature behavior in AlGaN-based deep-ultraviolet light-emitting diodes

Dong Yeong Kim, Jeonghyeon Park, Jaehee Cho, Jong Kyu Kim

AIP Advances· Volume 10· Issue 4

Abstract

The junction temperature, one of the major parameters that strongly affect the performance of light-emitting diodes (LEDs), increases during operation because of the power dissipated as heat within an LED device. Therefore, LED devices with poor characteristics are expected to have higher junction temperatures for the same driving conditions. In this study, an observation contrary to this expectation is presented: a deep-ultraviolet LED device with superior electrical characteristics shows a higher junction temperature at the same input electrical power than a device with poor characteristics. A simple equivalent circuit comprising a diode, a series resistor, and shunt components is employed to elucidate this counter-intuitive observation by considering the possible heat sources inside the LED device. It is found that the junction temperature is mainly dominated by the power dissipated at the diode instead of the other possible heat sources including the Joule heating effect of the resistive components.
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Research context

OpenAlex topics: GaN-based semiconductor devices and materials · Thin-Film Transistor Technologies · Silicon Carbide Semiconductor Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Materials Science and Engineering, Pohang University of Science and Technology 1 , Pohang 37673, South Korea

School of Semiconductor and Chemical Engineering, Jeonbuk National University 2 , Jeonju 54896, South Korea

Funding

National Research Foundation of Korea

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