journal article·2015-01-01Open access

Estimation of the temperature dependent interaction between uncharged point defects in Si

Eiji Kamiyama, Jan Vanhellemont, Koji Sueoka

AIP Advances· Volume 5· Issue 1

Abstract

A method is described to estimate the temperature dependent interaction between two uncharged point defects in Si based on DFT calculations. As an illustration, the formation of the uncharged di-vacancy V2 is discussed, based on the temperature dependent attractive field between both vacancies. For that purpose, all irreducible configurations of two uncharged vacancies are determined, each with their weight given by the number of equivalent configurations. Using a standard 216-atoms supercell, nineteen irreducible configurations of two vacancies are obtained. The binding energies of all these configurations are calculated. Each vacancy is surrounded by several attractive sites for another vacancy. The obtained temperature dependent of total volume of these attractive sites has a radius that is closely related with the capture radius for the formation of a di-vacancy that is used in continuum theory. The presented methodology can in principle also be applied to estimate the capture radius for pair formation of any type of point defects.
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Research context

OpenAlex topics: Silicon and Solar Cell Technologies · Semiconductor materials and interfaces · Silicon Nanostructures and Photoluminescence

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Okayama Prefectural University 1 Department of Communication Engineering, , 111 Kuboki, Soja-shi, Okayama-ken 719-1197, Japan

GlobalWafers Japan Co., Ltd. 2 , 30 Soya, Hadano, Kanagawa, 257-8566, Japan

Ghent University 3 Department of Solid State Sciences, , Krijgslaan 281-S1, Ghent B-9000, Belgium

Funding

Japan Science and Technology Agency

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