Estimation of the temperature dependent interaction between uncharged point defects in Si
Source abstract
Abstract
A method is described to estimate the temperature dependent interaction between two uncharged point defects in Si based on DFT calculations. As an illustration, the formation of the uncharged di-vacancy V2 is discussed, based on the temperature dependent attractive field between both vacancies. For that purpose, all irreducible configurations of two uncharged vacancies are determined, each with their weight given by the number of equivalent configurations. Using a standard 216-atoms supercell, nineteen irreducible configurations of two vacancies are obtained. The binding energies of all these configurations are calculated. Each vacancy is surrounded by several attractive sites for another vacancy. The obtained temperature dependent of total volume of these attractive sites has a radius that is closely related with the capture radius for the formation of a di-vacancy that is used in continuum theory. The presented methodology can in principle also be applied to estimate the capture radius for pair formation of any type of point defects.
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Research context
OpenAlex topics: Silicon and Solar Cell Technologies · Semiconductor materials and interfaces · Silicon Nanostructures and Photoluminescence
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Okayama Prefectural University 1 Department of Communication Engineering, , 111 Kuboki, Soja-shi, Okayama-ken 719-1197, Japan
GlobalWafers Japan Co., Ltd. 2 , 30 Soya, Hadano, Kanagawa, 257-8566, Japan
Ghent University 3 Department of Solid State Sciences, , Krijgslaan 281-S1, Ghent B-9000, Belgium
Funding
Japan Science and Technology Agency
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