journal article·2014-02-01Open access

Thickness and ordering temperature of surface NiO/Ni systems

Ying-Ta Shih, Chien-Yu Su, Chung-Wei Tsai, Wei Pan

AIP Advances· Volume 4· Issue 2

Abstract

We estimate the thickness and ordering temperature of an antiferromagnetic and passivation surface oxide through exchange bias coupling. The surface NiO, which is generated through the exposure of a Ni/Cu(001) surface to oxygen, is taken as a model system on which to perform the estimation. Since no exchange bias is found in the surface NiO/Ni/Cu(001), we have built a sandwich structure of NiO/n ML Ni/10 ML Co/Cu(001) to measure the n dependence of exchange bias. With n ⩽ 2, a large exchange bias field is found above 300 K, which could be due to the direct contact between the oxides and the Co layer. With 3 ⩽ n ⩽ 6, a smaller exchange bias field is found with a blocking temperature of 190 K. This implies that the thickness of NiO is, at most, 3 ML. Discovering the thickness and ordering temperature of the surface NiO provides us to explore the potential applications by using surface NiO.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: ZnO doping and properties · Magnetic properties of thin films · Magnetic and transport properties of perovskites and related materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

National Chung Cheng University Department of Physics, , Min-Hsiung, Chia-Yi 621, Taiwan

References (31)

Show source-provided references
1. J. Appl. Phys. · 2001 · 89 · 737410.1063/1.1359791 ↗
2. Phys. Rev. B · 2002 · 66 · 10440210.1103/PhysRevB.66.104402 ↗
3. J. Appl. Phys. · 2012 · 111 · 07C11310.1063/1.3676227 ↗
4. J. Appl. Phys. · 2011 · 109 · 07C11210.1063/1.3561765 ↗
5. IEEE Trans. Magn. · 2011 · 47 · 388310.1109/TMAG.2011.2157327 ↗
6. AIP Advances · 2014 · 4 · 01713210.1063/1.4864037 ↗
7. Appl. Phys. Lett. · 1999 · 74 · 251610.1063/1.123885 ↗
8. IBM Journal of Research and Development · 2000 · 44 · 31110.1147/rd.443.0311 ↗
9. Appl. Phys. Lett. · 2001 · 78 · 99010.1063/1.1347390 ↗
10. Nano Lett. · 2002 · 3 · 14910.1021/nl025875l ↗
11. Surf. Sci. · 2002 · 500 · 17210.1016/S0039-6028(01)01625-9 ↗
12. Phys. Rev. B · 2005 · 71 · 23540310.1103/PhysRevB.71.235403 ↗
13. Rev. Mod. Phys. · 2006 · 78 · 110.1103/RevModPhys.78.1 ↗
14. J. Appl. Phys. · 2007 · 102 · 01130110.1063/1.2750414 ↗
15. Thin Solid Films · 2009 · 517 · 256310.1016/j.tsf.2008.09.007 ↗
16. IEEE Trans. Magn. · 1996 · 32 · 316510.1109/20.508381 ↗
17. J. Magn. Magn. Mater. · 1999 · 192 · 20310.1016/S0304-8853(98)00266-2 ↗
18. Science · 2001 · 294 · 148810.1126/science.1065389 ↗
19. Rev. Mod. Phys. · 2004 · 76 · 32310.1103/RevModPhys.76.323 ↗
20. Phys. Rep. · 2005 · 422 · 6510.1016/j.physrep.2005.08.004 ↗
21. Phys. Rev. Lett. · 2007 · 99 · 11610110.1103/PhysRevLett.99.116101 ↗
22. Phys. Rev. Lett. · 1987 · 58 · 93310.1103/PhysRevLett.58.933 ↗
23. Phys. Rev. B · 1987 · 35 · 940310.1103/PhysRevB.35.9403 ↗
24. J. Appl. Phys. · 1997 · 81 · 503810.1063/1.364951 ↗
25. Appl. Phys. Lett. · 2013 · 102 · 03240110.1063/1.4788719 ↗
26. Sci. Rep. · 2013 · 3 · 109410.1038/srep01094 ↗
27. Phys. Rev. B · 2009 · 79 · 09440510.1103/PhysRevB.79.094405 ↗
28. Phys. Rev. B · 2001 · 64 · 09442910.1103/PhysRevB.64.094429 ↗
29. Phys. Rev. B · 2013 · 87 · 05442810.1103/PhysRevB.87.054428 ↗
30. J. Appl. Phys. · 2004 · 95 · 729710.1063/1.1652415 ↗
31. Phys. Rev. Lett. · 2000 · 84 · 610210.1103/PhysRevLett.84.6102 ↗