Wrinkling of extensional thin films through modified large deflection equations analytically and experimentally
Source abstract
Abstract
The stretch-induced wrinkling of thin films is solved through the modified von Kármán large deflection equations by first selecting the suitable deformation expressions that satisfy boundary conditions. Then, adopting the principle of minimum potential energy we obtain the deformations of simply supported rectangular thin films. The obtained significant deflections are nonlinearly elastic and of the lowest order of infinite solutions. The parameters of aspect ratio, the thickness and material of thin films are studied analytically and numerically. The highlighted results of wrinkle amplitude and load are in good agreement with experiments. The methodology also indicates the limit load impending plasticity and predicts the applied load precisely for each wrinkle. Further, it can be extended to the variety of multifunctional orthotropic and multi-layered thin films.
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Research context
OpenAlex topics: Advanced Materials and Mechanics · Structural Analysis and Optimization · Vibration and Dynamic Analysis
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Affiliations
National Sun Yat-Sen University Department of Mechanical and Electro-Mechanical Engineering, , Kaohsiung, 8024, Taiwan, ROC
Funding
Ministry of Science and Technology, Taiwan
References (35)
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