journal article·2013-12-01Open access

Quantitative hard x-ray phase contrast imaging of micropipes in SiC

V. G. Kohn, T. S. Argunova, J. H. Je

AIP Advances· Volume 3· Issue 12

Abstract

Peculiarities of quantitative hard x-ray phase contrast imaging of micropipes in SiC are discussed. The micropipe is assumed as a hollow cylinder with an elliptical cross section. The major and minor diameters can be restored using the least square fitting procedure by comparing the experimental data, i.e. the profile across the micropipe axis, with those calculated based on phase contrast theory. It is shown that one projection image gives an information which does not allow a complete determination of the elliptical cross section, if an orientation of micropipe is not known. Another problem is a weak accuracy in estimating the diameters, partly because of using pink synchrotron radiation, which is necessary because a monochromatic beam intensity is not sufficient to reveal the weak contrast from a very small object. The general problems of accuracy in estimating the two diameters using the least square procedure are discussed. Two experimental examples are considered to demonstrate small as well as modest accuracies in estimating the diameters.
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Research context

OpenAlex topics: Advanced X-ray Imaging Techniques · Advancements in Photolithography Techniques · Advanced Surface Polishing Techniques

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Affiliations

National Research Center “Kurchatov Institute” 1 , 123182, Moscow, Russia

RAS 2 Ioffe Physical-Technical Institute, , 194021 St. Petersburg, Russia

Pohang University of Science and Technology 3 X-ray Imaging Center, Department of Materials Science and Engineering, , San 31 Hyoja-dong, Namku, 790-784 Pohang, Republic of Korea

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