Magneto-optical characterization of TCO films using standard and enhanced configurations

Thin film samples like transparent conducting oxides (TCO) are typically investigated using measurements like Hall Effect and 4-point probe measurements. We use a sensitive AC Faraday rotation (FR) setup to study thin film samples for which a magneto-optic response is challenging to characterize. The experimental setup employs a stabilized He-Ne laser (633 nm) along with an AC magnetic field that enables lock-in detection. We investigate a series of TCO samples that are deposited on a glass substrate. The TCO samples include the more widely used Indium Tin Oxide (ITO) and the relatively newer Fluorine doped Tin Oxide films, usually referred to as FTO. These films have a magneto-optic response due to the presence of free carrier concentration and therefore measurement of this response (Verdet constant) could allow one to determine the carrier concentration of these films. Given that magneto optic responses like FR depend on the length of the sample length traveled by light, these sub-micron films pose considerable challenges in trying to extract the FR response of the film from that of the much thicker glass substrate. Furthermore, we present details of the design and FR characterization of samples using a Michelson interferometer-based measurement setup which enhances the Faraday rotation and affords a new means of studying harmonic peaks of the recorded optical signal in response to a sinusoidally-varying applied magnetic field. We compare some early results from this setup to the typical “single-pass” setup to highlight the difference in the recorded signals from the two setups. To showcase the advantages of the proposed measurements, we also include some early results from a very different type of sample, namely superparamagnetic nanoparticles (SNPs).