Analysis of Ohmic loss due to non-ideal boundary in relativistic backward wave oscillator
Source abstract
Abstract
Radio frequency Ohmic loss due to non-ideal conductor boundaries seriously limits the performance of electronic devices. In this paper, the Ohmic losses of two simple models are calculated by particle-in-cell (PIC) simulation, which is also verified by theoretical calculation. Thereafter, based on PIC simulation, we have studied the variation of the Ohmic losses of relativistic backward wave oscillators (RBWOs) with operating frequency and material conductivity. The PIC simulation results show that as the frequency advances, the Ohmic losses of RBWOs deteriorate sharply. The power loss becomes non-negligible when compared with the output power. The loss-power ratio of a V-band RBWO made of stainless steel is over 25%. The non-negligible Ohmic loss can explain to some extent that the difference between the simulated and the experimental output power of the RBWO becomes apparent as the working frequency increases.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Gyrotron and Vacuum Electronics Research · Microwave Engineering and Waveguides · Particle accelerators and beam dynamics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Key Laboratory of Particle and Radiation Imaging (Tsinghua University), Ministry of Education 1 , Beijing 100084, China
Science and Technology on High Power Microwave Laboratory, Northwest Institute of Nuclear Technology 2 , Xi’an, Shaanxi 710024, China
Department of Engineering Physics, Tsinghua University 3 , Beijing 100084, China
References (21)
Show source-provided references
1. IEEE Trans. Microwave Theory Tech. · 2000 · 48 · 158810.1109/22.869014 ↗
2. IEEE Trans. Intrum. Meas. · 1996 · 45 · 7710.1109/19.481315 ↗
3. IEEE Trans. Plasma Sci. · 1988 · 16 · 10510.1109/27.3801 ↗
4. IEEE Trans. Microwave Theory Tech. · 1995 · 43 · 138410.1109/22.390199 ↗
5. AIP Adv. · 2015 · 5 · 09715510.1063/1.4931455 ↗
6. Int. J. Electron. · 1974 · 37 · 36910.1080/00207217408900535 ↗
7. Mol. Phys. · 1991 · 73 · 130710.1080/00268979100101931 ↗
8. Photon beam properties at the European XFEL
9. Nucl. Instrum. Methods Phys. Res., Sect. A · 2014 · 734 · 2310.1016/j.nima.2013.07.021 ↗
10. Appl. Phys. Lett. · 1970 · 16 · 33310.1063/1.1653215 ↗
11. Rev. Accel. Sci. Technol. · 2008 · 1 · 21110.1142/s1793626808000149 ↗
12. Acta Phys. Sin. · 2015 · 64 · 07070310.7498/aps.64.070703 ↗
13. High Power Laser Part. Beams · 2014 · 26 · 8310410.3788/hplpb20142608.83104 ↗
14. Acta Phys. Sin. · 2020 · 69 · 04070110.7498/aps.69.20191488 ↗
15. IEEE Trans. Plasma Sci. · 2018 · 46 · 38410.1109/tps.2018.2792905 ↗
16. Appl. Surf. Sci. · 2005 · 251 · 410.1016/j.apsusc.2005.03.115 ↗
17. J. Vac. Sci. Technol. · 2008 · 26 · 77010.1116/1.2884755 ↗
18. IEEE Trans. Plasma Sci. · 2009 · 37 · 200210.1109/tps.2009.2026477 ↗
19. Phys. Plasmas · 2014 · 21 · 09310610.1063/1.4895660 ↗
20. IEEE Trans. Electron Devices · 2019 · 67 · 31410.1109/TED.2019.2952540 ↗
21. Phys. Plasmas · 2015 · 22 · 12311010.1063/1.4937777 ↗