Influence of TiO2 nanoparticle size on creeping flashover property of transformer oil-impregnated pressboards
Source abstract
Abstract
Nanoparticles have exhibited great potential in improving insulating property of liquid and solid dielectrics. To explore their modification mechanism on transformer oil-impregnated pressboards, TiO2 nanoparticles with different diameters of 5nm, 10nm, and 15nm were synthesized and used to prepare transformer oil-based nanofluids. The creeping flashover characteristics of both pure oil-impregnated paperboards (OPs) and nanofluid-impregnated pressboards (NPs) were examined under lightning impulse and AC voltages. It was found that the creeping flashover property of NPs is significantly improved with the decreasing of nanoparticle size. Especially, it is enhanced by 2.44 times under positive lighting impulse as nanoparticle size reduced from 15 nm to 5 nm. The results of space charge decay and trap characteristics reveal the decrease of nanoparticle size can lower trap depth and greatly enhance the space charge dissipation rate, leading to more uniform electric field distribution at the interface between nanofluid and pressboards and higher creeping flashover property.
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Research context
OpenAlex topics: High voltage insulation and dielectric phenomena · Power Transformer Diagnostics and Insulation · Lightning and Electromagnetic Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Beijing Key Laboratory of High Voltage & EMC, North China Electric Power University 1 , Beijing 102206, China
State key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University 2 , Beijing 102206, China
School of Energy, Power and Mechanical Engineering, North China Electric Power University 3 , Beijing 102206, China
Funding
State Key Laboratory of Advanced Power Transmission Technology · National Natural Science Foundation of China
References (37)
Show source-provided references
1. IEEE Trans. Dielectr. Electr. Insul · 1997 · 4 · 6410.1109/94.590868 ↗
2. IEEE Trans. Dielectr. Electr. Insul. · 2015 · 22 · 7210.1109/tdei.2014.004570 ↗
3. IEEE Electr. Insul. M. · 2012 · 28 · 4310.1109/mei.2012.6268441 ↗
4. J. Appl. Polym. Sci. · 2011 · 120 · 113310.1002/app.30467 ↗
5. J. Appl. Phys. · 2012 · 111 · 374
6. J. Appl. Polym. Sci. · 2012 · 126 · 29110.1002/app.36891 ↗
7. Mater · 2017 · 10 · 9010.3390/ma10010090 ↗
8. IEEE Trans. Dielectr. Electr. Insul. · 2012 · 19 · 75510.1109/tdei.2012.6215077 ↗
9. IEEE T. Plasma Sci. · 2016 · 44 · 258910.1109/tps.2016.2597362 ↗
10. IEEE Trans. Dielectr. Electr. Insul. · 2014 · 21 · 55610.1109/tdei.2013.004151 ↗
11. Appl. Phys. Lett. · 2013 · 102 · 13290210.1063/1.4799375 ↗
12. J. Appl. Phys. · 2011 · 110 · 10410410.1063/1.3660783 ↗
13. Appl. Phys. · 1975 · 46 · 397510.1063/1.322148 ↗
14. IEEE Trans. Dielectr. Electr. Insul. · 1992 · 27 · 92410.1109/14.256470 ↗
15. IEEE Trans. Dielectr. Electr. Insul. · 2013 · 41 · 334910.1109/tps.2013.2270377 ↗
16. Meas. Sci. Technol. · 2007 · 18 · 145310.1088/0957-0233/18/5/034 ↗
17. IEEE Electr. Insul. M. · 2010 · 26 · 3510.1109/mei.2010.5482553 ↗
18. IEEE Trans. Dielectr. Electr. Insul. · 2009 · 16 · 164010.1109/tdei.2009.5361584 ↗
19. IEEE Trans. Dielectr. Electr. Insul. · 2015 · 22 · 7210.1109/tdei.2014.004570 ↗
20. J. Appl. Phys. · 1972 · 43 · 292710.1063/1.1661633 ↗
21. J. Phys. D: Appl. Phys. · 1977 · 10 · 48710.1088/0022-3727/10/4/013 ↗
22. J. Phys. D: Appl. Phys. · 1985 · 18 · 115510.1088/0022-3727/18/6/019 ↗
23. IEEE Trans. Dielectr. Electr. Insul. · 2016 · 11 · 1049
24. IEEE Trans. Dielectr. Electr. Insul. · 2012 · 40 · 167
25. Acta Polymerica · 2010 · 34 · 265
26. Phys. D: Appl. Phys. · 2001 · 10 · 252510.1088/0022-3727/10/18/017 ↗
27. IEEE Trans. Dielectr. Electr. Insul. · 2012 · 19 · 60010.1109/tdei.2012.6180255 ↗
28. Aip. Advances · 2014 · 4 · 073306
29. High Voltage · 2016 · 1 · 7410.1049/hve.2016.0016 ↗
30. IEEE Trans. Dielectr. Electr. Insul. · 2004 · 11 · 73910.1109/tdei.2004.1349779 ↗
31. J. Phys. Chem. B · 1998 · 102 · 1087110.1021/jp982948+ ↗
32. Phys. Lett. A · 1990 · 149 · 48110.1016/0375-9601(90)90221-9 ↗
33. Rev. Mod. Phys. · 1974 · 46 · 45110.1103/revmodphys.46.451 ↗
34. Phys. Chem. Solids · 1985 · 46 · 70910.1016/0022-3697(85)90160-x ↗
35. IEEE Trans. Dielectr. Electr. Insul. · 2005 · 12 · 85710.1109/tdei.2005.1522182 ↗
36. Chem. Rev. · 1995 · 95 · 73510.1021/cr00035a013 ↗
37. J. Electrosta. · 2011 · 69 · 25510.1016/j.elstat.2011.04.001 ↗