A device for measuring electron beam characteristics
Source abstract
Abstract
This paper presents a device intended for diagnostics of electron beams and the results obtained with this device. The device comprises a rotating double probe operating in conjunction with an automated probe signal collection and processing system. This provides for measuring and estimating the electron beam characteristics such as radius, current density, power density, convergence angle, and brightness.
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Research context
OpenAlex topics: Gyrotron and Vacuum Electronics Research · Pulsed Power Technology Applications · GaN-based semiconductor devices and materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Institute of High Current Electronics SB RAS 1 , Tomsk 634055, Russia
Tomsk State University of Control Systems and Radioelectronics 2 , Tomsk 634050, Russia
Funding
Ministry of Education and Science of the Russian Federation
References (7)
Show source-provided references
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