Iron-boron pair dissociation in silicon under strong illumination
Source abstract
Abstract
The dissociation of iron-boron pairs (FeB) in Czochralski silicon under strong illumination was investigated. It is found that the dissociation process shows a double exponential dependence on time. The first fast process is suggested to be caused by a positive Fe in FeB capturing two electrons and diffusion triggered by the electron-phonon interactions, while the second slow one would involve the capturing of one electron followed by temperature dependent dissociation with an activation energy of (0.21 ± 0.03) eV. The results are important for understanding and controlling the behavior of FeB in concentrator solar cells.
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Research context
OpenAlex topics: Silicon and Solar Cell Technologies · Semiconductor materials and interfaces · Photovoltaic System Optimization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Zhejiang University State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, , Hangzhou 310027, People's Republic of China
References (26)
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