journal article·2018-09-01Open access

Extended-wavelength InGaAsSb infrared unipolar barrier detectors

Hongyue Hao, Guowei Wang, Xi Han, Dongwei Jiang, Yaoyao Sun, Chunyan Guo, Wei Xiang, Yingqiang Xu, Zhichuan Niu

AIP Advances· Volume 8· Issue 9

Abstract

We presented an extended-wavelength InGaAsSb infrared unipolar barrier detector working at room temperature. The detector with GaSb lattice-matched InGaAsSb absorb layer and AlGaAsSb unipolar barrier can achieve high material quality and low dark current. The dark current density was 2.29×10-5 A/cm2 at 0 bias at 77K. At room temperature the dark current at 0 bias was 4×10-3 A/cm2 and the R0A is high to 44 Ω · cm2. We fabricated the cone arrays in the InGaAsSb absorb layer to reduce the reflection of the radiation and extend the spectrum response to visible area. The extended-wavelength detector had the response from the wavelength of 0.4 μm. Further experiment showed the cone arrays also reduced the dark current of the detector at room temperature.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Advanced Semiconductor Detectors and Materials · Semiconductor Quantum Structures and Devices · Terahertz technology and applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences 1 , 100083 Beijing, China

College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences 2 , 100049 Beijing, China

Funding

National Basic Research Program of China · National Natural Science Foundation of China · China Postdoctoral Science Foundation

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