A wavelet ridge extraction method employing a novel cost function in two-dimensional wavelet transform profilometry

We present a new wavelet ridge extraction method employing a novel cost function in two-dimensional wavelet transform profilometry (2-D WTP). First of all, the maximum value point is extracted from two-dimensional wavelet transform coefficient modulus, and the local extreme value points over 90% of maximum value are also obtained, they both constitute wavelet ridge candidates. Then, the gradient of rotate factor is introduced into the Abid’s cost function, and the logarithmic Logistic model is used to adjust and improve the cost function weights so as to obtain more reasonable value estimation. At last, the dynamic programming method is used to accurately find the optimal wavelet ridge, and the wrapped phase can be obtained by extracting the phase at the ridge. Its advantage is that, the fringe pattern with low signal-to-noise ratio can be demodulated accurately, and its noise immunity will be better. Meanwhile, only one fringe pattern is needed to projected to measured object, so dynamic three-dimensional (3-D) measurement in harsh environment can be realized. Computer simulation and experimental results show that, for the fringe pattern with noise pollution, the 3-D surface recovery accuracy by the proposed algorithm is increased. In addition, the demodulation phase accuracy of Morlet, Fan and Cauchy mother wavelets are compared.