One dimensional FexCo1-x nanowires; ferromagnetic resonance and magnetization dynamics
Source abstract
Abstract
Soft magnetic nanowires (NWs) are widely used for microwave and mm-wave components. The investigation of magnetization damping behavior of NWs have attracted great interest due to large influence of loss to the device, like integrated microwave device, magnetic sensors, and magnetic random access memory. With increasing operational frequency and degree of integration, the requirements to characterize 1-dimensional NWs become increasingly high. The purpose of this work is to study the magnetization dynamics in FexCo1-x NWs. A series of FexCo1-x (x=0, 0.25, 0.5, 0.75, 1) NWs were grown by controlled electro-deposition. By adjusting FexCo1-x concentration (x=0 to 1), the saturation magnetization, increased more than 20%. Ferromagnetic resonance (FMR) both in field and frequency sweep mode are employed to characterize the NWs in flip-chip geometry. It is observed that FMR field (Hr) increases with increase in applied frequency. At a fixed frequency, Fe NWs resonate at a lower field than the Co substituted NWs. FMR field linewidth (ΔH) as well as frequency width (Δf) are largest for Co NWs and decreased for Fe NWs. Whereas ΔH and Δf decreased further for FexCo1-x nanowires with increasing x.
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Research context
OpenAlex topics: Magnetic properties of thin films · Magnetic Properties and Applications · Semiconductor materials and interfaces
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Jawaharlal Nehru University 1 Special Centre for Nanoscience, , New Mehrauli Road, New Delhi 110067, India
University of Delhi 2 Bhaskaracharya College of Applied Sciences, , Dwarka, New Delhi 110075, India
University of Colorado at Colorado Springs 3 Department of Physics, , Colorado Springs, Colorado 80918, USA
Funding
Nano Mission Council, Department of Science and Technology
References (18)
Show source-provided references
1. Sci Rep · 2015 · 5 · 960310.1038/srep09603 ↗
2. IEEE Trans. Nanotechnol. · 2009 · 8 · 28110.1109/tnano.2009.2015758 ↗
3. Physical Review B · 2002 · 66 · 1310.1103/physrevb.66.134436 ↗
4. J. Appl. Phys. · 1996 · 79 · 457810.1063/1.361732 ↗
5. J. Magn. Magn. Mater. · 2009 · 321 · 205510.1016/j.jmmm.2008.03.060 ↗
6. Appl. Phys. Lett. · 2009 · 94 · 11250910.1063/1.3103562 ↗
7. J. Magn. Magn. Mater. · 2004 · 272–276 · 165210.1016/j.jmmm.2003.12.233 ↗
8. IEEE Trans. Magn. · 2009 · 45 · 405210.1109/tmag.2009.2024880 ↗
9. J. Vac. Sci. Technol., B · 2007 · 25 · 261910.1116/1.2801964 ↗
10. J. Magn. Magn. Mater. · 2009 · 321 · 114210.1016/j.jmmm.2008.10.039 ↗
11. Scripta Materialia · 2016 · 113 · 8910.1016/j.scriptamat.2015.10.013 ↗
12. J. Appl. Phys. · 1985 · 57 · 369010.1063/1.334991 ↗
13. Appl. Phys. Lett · 2003 · 82 · 211210.1063/1.1564866 ↗
14. J. Appl. Phys. · 1999 · 85 · 515110.1063/1.369107 ↗
15. J. Appl. Phys. · 2004 · 95 · 564610.1063/1.1697641 ↗
16. J. Appl. Phys. · 1968 · 39 · 306010.1063/1.1656733 ↗
17. Phys. Rev. B · 1999 · 60 · 739510.1103/physrevb.60.7395 ↗
18. App. Phy. Lett. · 2005 · 87 · 01250210.1063/1.1968433 ↗