Enhanced ferromagnetic resonance linewidth of the free layer in perpendicular magnetic tunnel junctions
Source abstract
Abstract
We report the frequency dependence of the ferromagnetic resonance linewidth of the free layer in magnetic tunnel junctions with all perpendicular–to–the–plane magnetized layers. While the magnetic–field–swept linewidth nominally shows a linear growth with frequency in agreement with Gilbert damping, an additional frequency–dependent linewidth broadening occurs that shows a strong asymmetry between the absorption spectra for increasing and decreasing external magnetic field. Inhomogeneous magnetic fields produced during reversal of the reference and pinned layer complex is demonstrated to be at the origin of the symmetry breaking and the linewidth enhancement. Consequentially, this linewidth enhancement provides indirect information on the magnetic coercivity of the reference and pinned layers. These results have important implications for the characterization of perpendicular magnetized magnetic random access memory bit cells.
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Research context
OpenAlex topics: Magnetic properties of thin films · Characterization and Applications of Magnetic Nanoparticles · Advanced Memory and Neural Computing
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
NIST 1 Materials Science and Engineering Division, , Gaithersburg, Maryland 20899, USA
NIST 2 Center for Nanoscale Science and Technology, , Gaithersburg, Maryland 20899, USA
Avalanche Technology 3 , Fremont, California 95438, USA
Funding
National Institute of Standards and Technology Nanofabrication Facility
References (13)
Show source-provided references
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