journal article·2016-06-01Open access

Cold welding of organic light emitting diode: Interfacial and contact models

J. Asare, S. A. Adeniji, O. K. Oyewole, B. Agyei-Tuffour, J. Du, E. Arthur, A. A. Fashina, M. G. Zebaze Kana, W. O. Soboyejo

AIP Advances· Volume 6· Issue 6

Abstract

This paper presents the results of an analytical and computational study of the contacts and interfacial fracture associated with the cold welding of Organic Light Emitting diodes (OLEDs). The effects of impurities (within the possible interfaces) are explored for contacts and interfacial fracture between layers that are relevant to model OLEDs. The models are used to study the effects of adhesion, pressure, thin film layer thickness and dust particle modulus (between the contacting surfaces) on contact profiles around impurities between cold-welded thin films. The lift-off stage of thin films (during cold welding) is then modeled as an interfacial fracture process. A combination of adhesion and interfacial fracture theories is used to provide new insights for the design of improved contact and interfacial separation during cold welding. The implications of the results are discussed for the design and fabrication of cold welded OLED structures.
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Research context

OpenAlex topics: Electronic Packaging and Soldering Technologies · Adhesion, Friction, and Surface Interactions · 3D IC and TSV technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

African University of Science and Technology 1 Department of Theoretical and Applied Physics, , Km 10 Airport Road, Abuja, Federal Capital Territory, Nigeria

Baze University 2 Department of Physics, , Plot 686 Cadastral Zone C00, Kuchigoro, Abuja, Federal Capital Territory, Nigeria

African University of Science and Technology 3 Department of Materials Science and Engineering, , Km 10 Airport Road, Abuja, Federal Capital Territory, Nigeria

Kwara State University 4 Department of Materials Science and Engineering, , Malete, Kwara State, Nigeria

Pennsylvania State University 5 Department of Mechanical & Nuclear Engineering, , University Park, Pennsylvania, USA

Princeton University 6 Department of Mechanical and Aerospace Engineering, Olden Street, , New Jersey, USA

Princeton Institute of Science and Technology of Materials (PRISM) 7 , 70 Prospect Street, Princeton, New Jersey, 08544, USA

References (55)

Show source-provided references
1. Nano Lett. · 2010 · 10 · 127610.1021/nl903892x ↗
2. J. Appl. Phys. · 2010 · 107 · 110.1063/1.3305791 ↗
3. J. Appl. Phys. · 2005 · 98 · 3371310.1063/1.1994935 ↗
4. J. Appl. Phys. · 2005 · 97 · 11351210.1063/1.1900285 ↗
5. J. Appl. Phys. · 2009 · 106 · 10350410.1063/1.3259422 ↗
7. J. Phys. D. Appl. Phys. · 1972 · 5 · 189010.1088/0022-3727/5/10/321 ↗
8. J. Mech. Phys. Solids · 2009 · 57 · 77610.1016/j.jmps.2008.12.001 ↗
9. Nat. Nanotechnol. · 2010 · 5 · 21810.1038/nnano.2010.4 ↗
10. J. Vac. Sci. Technol. B · 2012 · 30 · 1080110.1116/1.3661355 ↗
11. A.M. Kendale and D.L. Trumper, US7665983 B2 (2010).
12. Langmuir · 2003 · 19 · 630110.1021/la034464x ↗
13. J. Appl. Phys. · 2000 · 88 · 431010.1063/1.1289816 ↗
14. Chem. Mater. · 2009 · 21 · 531910.1021/cm902506a ↗
15. Adv. Mater. · 2003 · 15 · 54110.1002/adma.200390127 ↗
16. Disp. Technol. J. · 2013 · 9 · 60110.1109/JDT.2013.2253085 ↗
17. Nanoscale · 2011 · 3 · 266310.1039/c1nr10039d ↗
18. Chem. Mater. · 2004 · 16 · 482410.1021/cm0496117 ↗
19. Science (80-. ) · 2000 · 288 · 83110.1126/science.288.5467.831 ↗
20. Mater. Horizons · 2015
21. J. Phys. Chem. C · 2011 · 115 · 2287010.1021/jp207842v ↗
22. J. Appl. Phys. · 2015 · 118 · 07530210.1063/1.4928729 ↗
23. Mater. Sci. Eng. A · 2006 · 427 · 23210.1016/j.msea.2006.04.080 ↗
24. Eng. Fract. Mech. · 2004 · 71 · 121910.1016/S0013-7944(03)00210-8 ↗
25. J. Appl. Phys. · 2014 · 115 · 08450410.1063/1.4867051 ↗
26. Adv. Mater. Res. · 2016 · 1132 · 20410.4028/www.scientific.net/AMR.1132.204 ↗
27. Solid-State Sens. Actuator Work. 5th Tech. Dig. IEEE · 1992 · 212 · 20810.1109/SOLSEN.1992.228291 ↗
28. Nature · 1990 · 347 · 53910.1038/347539a0 ↗
29. J. Mech. Sci. Technol. · 2010 · 24 · 123510.1007/s12206-010-0401-9 ↗
30. Int. J. Eng. Sci. · 1965 · 3 · 4710.1016/0020-7225(65)90019-4 ↗
31. J. Appl. Phys. · 2014 · 116 · 07450610.1063/1.4892393 ↗
32. Ultramicroscopy · 2004 · 100 · 37510.1016/j.ultramic.2003.11.015 ↗
33. J. Appl. Phys. · 2015 · 117 · 23550110.1063/1.4922665 ↗
34. Nature · 1998 · 393 · 14610.1038/30193 ↗
35. Thin Solid Films · 1996 · 278 · 1210.1016/0040-6090(95)08117-8 ↗
36. 2003
37. The Royal Society · 1995 · 450
38. 1994
39. Org. Electron. Physics, Mater. Appl. · 2013 · 14 · 1262
40. J. Appl. PHYSICS, Am. Inst. Phys. · 2009 · 106 · 1
41. IBM J. Res. Dev. · 1994 · 38 · 37910.1147/rd.384.0379 ↗
42. J. Basic Eng. · 1963 · 85 · 51910.1115/1.3656897 ↗
43. Eng. Fract. Mech. · 1987 · 28 · 66310.1016/0013-7944(87)90060-9 ↗
44. 1973 · 449
45. Int. J. Fract. · 1979 · 15 · 42910.1007/BF00023330 ↗
46. Comput. Mech. Springer · 1997 · 19 · 54510.1007/s004660050207 ↗
47. Int. J. Solids Struct. · 2004 · 41 · 742310.1016/j.ijsolstr.2004.06.006 ↗
48. Adv. Appl. Mech. · 1992 · 29 · 191
49. Int. J. Fract. · 1990 · 43 · 110.1007/BF00018123 ↗
50. J. Mech. Phys. Solids · 2004 · 52 · 89110.1016/S0022-5096(03)00121-2 ↗
51. J. Sandw. Struct. Mater. · 2007 · 9 · 44510.1177/1099636207070578 ↗
52. Components, Packag. Manuf. Technol. Part A, IEEE Trans. · 1995 · 18 · 61810.1109/95.465161 ↗
53. Mater. Sci. Eng. A · 2008 · 488 · 38110.1016/j.msea.2007.11.038 ↗
54. Langmuir · 2001 · 17 · 205110.1021/la010158c ↗
55. Nucl. Instruments Methods Phys. Res. Sect. B Beam Interact. with Mater. Atoms · 2003 · 208 · 28110.1016/S0168-583X(03)00644-X ↗