Hole mobility enhancement of MEH-PPV film by heat treatment at Tg
Source abstract
Abstract
The hole mobility of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) film was measured using the time-of-flight method. The hole mobility was enhanced 4-fold after annealing at around the glass transition temperature (Tg). Optical, atomic force, and Kelvin force microscopies, and grazing-incidence X-ray diffraction measurements indicate the enhancement can be attributed to a homogeneous film structure, a homogeneous Fermi level energy, and a face-on oriented structure, all of which were established by annealing at Tg.
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Research context
OpenAlex topics: Organic Electronics and Photovoltaics · Conducting polymers and applications · Luminescence and Fluorescent Materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Hiroshima University 1 Natural Science Center for Basic Research and Development (N-BARD), , 1-3-1 Kagamiyama, Higashi-hiroshima, Hiroshima 739-8526, Japan
Japan Synchrotron Radiation Research Institute 2 , 1-1-1, Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan
Hiroshima University 3 Department of Chemistry, Graduate School of Science, , 1-3-1 Kagamiyama, Higashi-hiroshima, Hiroshima 739-8526, Japan
Funding
Japan Society for the Promotion of Science
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