Manipulation of perpendicular exchange bias effect in [Co/Ni]N/(Cu, Ta)/TbCo multilayer structures
Source abstract
Abstract
With the demand for increasing storage density in spintronic applications, extensive work has been devoted to searching for perpendicular magnetic material systems with strong exchange bias effect. In this study we have investigated the exchange bias effect in perpendicular magnetized heterostructures of [Co/Ni]N/(Cu, Ta)/TbCo. An interlayer of 0.8 nm Cu is capable of achieving separate magnetization switching, showing a quite large exchange bias field over 2.9 kOe. With increasing the interlayer thickness, both the Co/Ni bias field and TbCo switching field decrease much more rapidly for the samples with a Ta interlayer as compared to the Cu case, due to the better coverage ability of the amorphous nature. The influence of layer thickness and composition of the FM and FI layers has also been investigated and the variation tendencies are well interpreted.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Magnetic properties of thin films · Magnetic Properties and Applications · Metallic Glasses and Amorphous Alloys
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Fudan University 1 Key Laboratory of Micro and Nano Photonic Structures (Ministry of Education), Department of Optical Science and Engineering, , Shanghai 200433, China
East China Normal University 2 Department of Physics, , Shanghai 200062, China
Funding
National Natural Science Foundation of China
References (20)
Show source-provided references
1. Phys. Rev. · 1956 · 102 · 141310.1103/PhysRev.102.1413 ↗
2. Appl. Phys. Lett. · 2003 · 83 · 353710.1063/1.1619562 ↗
3. J. Appl. Phys. · 2013 · 113 · 03390110.1063/1.4775837 ↗
4. Thin Solid Films · 2013 · 534 · 55310.1016/j.tsf.2013.02.040 ↗
5. Phys. Rev. B · 2010 · 81 · 21240410.1103/PhysRevB.81.212404 ↗
6. Phys. Rev. Lett. · 1997 · 79 · 113010.1103/PhysRevLett.79.1130 ↗
7. J. Appl. Phys. · 2012 · 111 · 08390410.1063/1.3703666 ↗
8. Appl. Phys. Lett. · 2012 · 101 · 22240410.1063/1.4767142 ↗
9. Phys. Rev. B · 2013 · 87 · 05441510.1103/PhysRevB.87.054415 ↗
10. Nat. Commun. · 2012 · 3 · 71510.1038/ncomms1728 ↗
11. Appl. Phys. Lett. · 2012 · 101 · 16240810.1063/1.4759109 ↗
12. Nat. Mater. · 2006 · 5 · 21010.1038/nmat1595 ↗
13. Appl. Phys. Lett. · 2013 · 102 · 10240110.1063/1.4795013 ↗
14. J. Appl. Phys. · 2011 · 109 · 02390710.1063/1.3536476 ↗
15. Nano-Micro Lett. · 2014 · 6 · 35910.1007/s40820-014-0009-1 ↗
16. Sci. Rep. · 2015 · 5 · 1086310.1038/srep10863 ↗
17. Springer Tracts Mod. Phys. · 2008 · 227 · 9710.1007/978-3-540-73462-8_3 ↗
18. J. Appl. Phys. · 1987 · 62 · 304710.1063/1.339367 ↗
19. J. Magn. Magn. Mater. · 2015 · 390 · 13710.1016/j.jmmm.2015.04.061 ↗
20. IEEE Trans. Mag. · 2011 · 47 · 312910.1109/TMAG.2011.2157310 ↗