journal article·2018-02-01Open access

Dual-color short-wavelength infrared photodetector based on InGaAsSb/GaSb heterostructure

T. D. Nguyen, J. O. Kim, Y. H. Kim, E. T. Kim, Q. L. Nguyen, S. J. Lee

AIP Advances· Volume 8· Issue 2

Abstract

We report the spectral response characteristics of a dual–band infrared photodetector based on nBn photodiode configuration–with GaSb and InGaAsSb absorption layers and a ternary layer of AlGaSb that serves as unipolar barrier in between—which has independent access to both sides. The resulting structure has detection capability in the short-wavelength infrared ranges, cut-off wavelength of 1.6 μm (SWIR1; GaSb) and 2.65 μm (SWIR2; InGaAsSb) depending on the applied bias. The dual-band photodetector was evaluated by current–voltage (I–V) characteristics, spectral response, and detectivity (D*). The measured values of D* at 300 K were 2.3 × 1012 cm·Hz1/2·W−1 (at 1.5 μm) and 2.1 × 1011 cm·Hz1/2·W−1 (at 2.25 μm).
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Research context

OpenAlex topics: Advanced Semiconductor Detectors and Materials · Semiconductor Quantum Structures and Devices · Thermography and Photoacoustic Techniques

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Affiliations

Division of Industrial Metrology, Korean Research Institute of Standards and Science 1 , Daejeon, Republic of Korea , 305–340

Department of Materials Science & Engineering, Chungnam National University 2 , Daejeon, Republic of Korea , 305–764

Institute of Materials Science, Vietnam Academy of Science and Technology 3 , Hanoi, Vietnam

Funding

Korea Research Institute of Standards and Science · MOTIE | Korea Evaluation Institute of Industrial Technology

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