Band alignment of TiO2/FTO interface determined by X-ray photoelectron spectroscopy: Effect of annealing
Abstract
Research context
OpenAlex topics: Electronic and Structural Properties of Oxides · ZnO doping and properties · Chalcogenide Semiconductor Thin Films
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Affiliations
Shaanxi Normal University 1 Key Laboratory of Applied Surface and Colloid Chemistry, National Ministry of Education; Shaanxi Engineering Lab for Advanced Energy Technology; School of Materials Science and Engineering, , Xi’an 710119, China
Northwest University 2 School of Physics, , Xi’an 710069, China
Xi’an Technological University 3 School of Science, , Xi’an, Shaanxi 710062, China
Chinese Academy of Sciences 4 Dalian Institute of Chemical Physics, Dalian National Laboratory for Clean Energy, , Dalian, 116023, China
Funding
Changjiang Scholar and Innovative Research Team · Chinese National 1000-talent-plan Program · National university Research Fund · Overseas Talent Recruitment Project · National Natural Science Foundation of China · Natural Science Foundation of Shaanxi Province