Rocksalt MgS solar blind ultra-violet detectors
Source abstract
Abstract
Studies using in-situ Auger electron spectroscopy and reflection high energy electron diffraction, and ex-situ high resolution X-ray diffraction and electron backscatter diffraction reveal that a MgS thin film grown directly on a GaAs (100) substrate by molecular beam epitaxy adopts its most stable phase, the rocksalt structure, with a lattice constant of 5.20 Å. A Au/MgS/n+-GaAs (100) Schottky-barrier photodiode was fabricated and its room temperature photoresponse was measured to have a sharp fall-off edge at 235 nm with rejection of more than three orders at 400 nm and higher than five orders at 500 nm, promising for various solar-blind UV detection applications.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Ga2O3 and related materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
The Hong Kong University of Science and Technology 1 Nano Science and Nano Technology Program, , HKSAR, People's Republic of China
The Hong Kong University of Science and Technology 2 Department of Physics and William Mong Institute of Nano Science and Technology, , HKSAR, People's Republic of China
University of Macau 3 Faculty of Science and Technology, , Macau, People's Republic of China
University of Macau 4 Department of Electrical and Computer Engineering, , Macau, People's Republic of China
References (30)
Show source-provided references
1. 2006
2. Appl. Phys. Lett. · 2001 · 78 · 181110.1063/1.1358364 ↗
3. Razeghi · 2005 · 375
4. Exp. Tech. · 2008 · 51 · 131
5. Appl. Phys. Lett. · 2009 · 94 · 22210210.1063/1.3147197 ↗
6. Opt. Lett. · 2009 · 34 · 167510.1364/OL.34.001675 ↗
7. Adv. Mater. · 2009 · 21 · 462510.1002/adma.200901108 ↗
8. Appl. Phys. Lett. · 2008 · 93 · 17350510.1063/1.3002371 ↗
9. Solid State Commun. · 2009 · 49 · 202110.1016/j.ssc.2009.08.030 ↗
10. Appl. Phys. Lett. · 2009 · 95 · 13111310.1063/1.3238571 ↗
11. JPN. J. Appl. Phys. · 2003 · 42 · L40110.1143/JJAP.42.L401 ↗
12. Phys. Rev. B · 1998 · 57 · 225710.1103/PhysRevB.57.2257 ↗
13. Phys. Stat. Sol. (b) · 2003 · 240 · 56510.1002/pssb.200301889 ↗
14. Mater. Lett. · 2007 · 61 · 117810.1016/j.matlet.2006.06.079 ↗
15. Phys. Rev. B · 1991 · 43 · 922810.1103/PhysRevB.43.9228 ↗
16. Phys. Rev. B · 2001 · 64 · 19530910.1103/PhysRevB.64.195309 ↗
17. Phys. Stat. Sol. B · 2010 · 247 · 139610.1002/pssb.200983190 ↗
18. See supplementary material at http://dx.doi.org/10.1063/1.3690124 for Auger Scan of the MgS thin films and in-situ RHEED patterns during the growth.
19. 1995
20. J. PhysChem Solids · 1994 · 55 · 41310.1016/0022-3697(94)90166-X ↗
21. Acta Crystal · 1994 · A50 · 62110.1107/S0108767393013947 ↗
22. JCPDS—ICDD · 2000
23. JCPDS—ICDD · 2000
24. Phys. Rev. B · 2009 · 79 · 23531010.1103/PhysRevB.79.235310 ↗
25. Hydrometallurgy · 1999 · 53 · 15510.1016/S0304-386X(99)00039-0 ↗
26. Surf. Sci. · 1999 · 45 · 2210.1016/S0039-6028(99)00102-8 ↗
27. Solid Films · 2000 · 367 · 13410.1016/S0040-6090(00)00663-5 ↗
28. Phys. Rev. B · 1989 · 40 · 330110.1103/PhysRevB.40.3301 ↗
29. Appl. Phys. Lett. · 1992 · 60 · 119910.1063/1.107404 ↗
30. Acta Crystallogr. · 1976 · B32 · 98310.1107/S0567740876004445 ↗